Description

Book Synopsis
Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today''s integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconduc

Table of Contents
Reliability Mathematics.

Principal Failure Mechanisms.

Failure Mechanisms in Technologies and Circuits.

Reliability Testing.

Reliability Prediction.

Screening.

Failure Analysis.

Quality Assurance.

Appendix.

Indexes.

Failure Mechanisms in Semiconductor Devices

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    A Hardback by E. Ajith Amerasekera, Farid N. Najm

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      Book details

      Publisher John Wiley & Sons Inc
      Published 20 June 1997
      ISBN-13 9780471954828
      978-0471954828
      ISBN-10 0471954829
      Also in:
      Condensed matter physics Electronic devices and materials Testing of materials

      Description

      Book Synopsis
      Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today''s integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconduc

      Table of Contents
      Reliability Mathematics.

      Principal Failure Mechanisms.

      Failure Mechanisms in Technologies and Circuits.

      Reliability Testing.

      Reliability Prediction.

      Screening.

      Failure Analysis.

      Quality Assurance.

      Appendix.

      Indexes.

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