Description

This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques.
The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.

Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering

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£54.99

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Paperback / softback by Yutaka Yoshida , Guido Langouche

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Short Description:

This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the... Read more

    Publisher: Springer Verlag, Japan
    Publication Date: 31/03/2016
    ISBN13: 9784431557999, 978-4431557999
    ISBN10: 4431557997

    Number of Pages: 487

    Non Fiction , Technology, Engineering & Agriculture , Education

    Description

    This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques.
    The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.

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