Description

Book Synopsis

This comprehensive book reports on recent investigations of lattice imperfections in semiconductors by means of positron annihilation. It reviews positron techniques, and describes the application of these techniques to various kinds of defects, such as vacancies, impurity vacancy complexes and dislocations.



Table of Contents
1 Introduction.- 2 Experimental Techniques.- 3 Basics of Positron Annihilation in Semiconductors.- 4 Defect Characterization in Elemental Semiconductors.- 5 Defect Characterization in III–V Compounds.- 6 Defect Characterization in II–VI Compounds.- 7 Defect Characterization in Other Compounds.- 8 Applications of Positron Annihilation in Defect Engineering.- 9 Comparison of Positron Annihilation with Other Defect-Sensitive Techniques.- A1 Semiconductor Data.- A2 Trapping Model Equations.- References.

Positron Annihilation in Semiconductors: Defect

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    A Paperback / softback by Reinhard Krause-Rehberg, Hartmut S. Leipner

    15 in stock

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      View other formats and editions of Positron Annihilation in Semiconductors: Defect by Reinhard Krause-Rehberg

      Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
      Publication Date: 01/12/2010
      ISBN13: 9783642084034, 978-3642084034
      ISBN10: 3642084036
      Also in:
      Condensed matter physics Spectrum analysis Engineering applications of electronic, magnetic materials

      Description

      Book Synopsis

      This comprehensive book reports on recent investigations of lattice imperfections in semiconductors by means of positron annihilation. It reviews positron techniques, and describes the application of these techniques to various kinds of defects, such as vacancies, impurity vacancy complexes and dislocations.



      Table of Contents
      1 Introduction.- 2 Experimental Techniques.- 3 Basics of Positron Annihilation in Semiconductors.- 4 Defect Characterization in Elemental Semiconductors.- 5 Defect Characterization in III–V Compounds.- 6 Defect Characterization in II–VI Compounds.- 7 Defect Characterization in Other Compounds.- 8 Applications of Positron Annihilation in Defect Engineering.- 9 Comparison of Positron Annihilation with Other Defect-Sensitive Techniques.- A1 Semiconductor Data.- A2 Trapping Model Equations.- References.

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