Description

Book Synopsis
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers,

Trade Review
Review of the hardback: 'The subject is treated in a clear and logical fashion … Dr Reed has produced an excellent and thoroughly readable book … highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine
Review of the hardback: 'A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style … It is strongly recommended for new users and should have a place in every laboratory. It would make an excellent textbook for introductory courses.' M. T. Styles, Analyst
Review of the hardback: 'This book is a valuable introduction to the use and geological application of scanning electron microscopes and electron microprobes … by far the most readable of the microscope/microprobe books that I have seen … It is pitched at the right level for the market at which it is aimed, postgraduate and postdoctoral workers, or geologists in industrial laboratories … It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory and be required reading for any graduate student working with microbeam techniques.' Peter Treloar, Geoscientist
Review of the hardback: ' …this is a book that has been long overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology

Table of Contents
Preface; Acknowledgements; 1. Introduction; 2. Electron-specimen interactions; 3. Instrumentation; 4. Scanning electron microscopy; 5. X-ray spectrometers; 6. Element mapping; 7. X-ray analysis (1); 8. X-ray analysis (2); 9. Sample preparation; Appendix; References; Index.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

    Product form

    £39.89

    Includes FREE delivery

    RRP £41.99 – you save £2.10 (5%)

    Order before 4pm today for delivery by Sat 27 Jun 2026.

    A Paperback by S. J. B. Reed

    15 in stock


      View other formats and editions of Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by S. J. B. Reed

      Publisher: Cambridge University Press
      Publication Date: 6/10/2010 12:00:00 AM
      ISBN13: 9780521142304, 978-0521142304
      ISBN10: 052114230X

      Description

      Book Synopsis
      Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers,

      Trade Review
      Review of the hardback: 'The subject is treated in a clear and logical fashion … Dr Reed has produced an excellent and thoroughly readable book … highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine
      Review of the hardback: 'A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style … It is strongly recommended for new users and should have a place in every laboratory. It would make an excellent textbook for introductory courses.' M. T. Styles, Analyst
      Review of the hardback: 'This book is a valuable introduction to the use and geological application of scanning electron microscopes and electron microprobes … by far the most readable of the microscope/microprobe books that I have seen … It is pitched at the right level for the market at which it is aimed, postgraduate and postdoctoral workers, or geologists in industrial laboratories … It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory and be required reading for any graduate student working with microbeam techniques.' Peter Treloar, Geoscientist
      Review of the hardback: ' …this is a book that has been long overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology

      Table of Contents
      Preface; Acknowledgements; 1. Introduction; 2. Electron-specimen interactions; 3. Instrumentation; 4. Scanning electron microscopy; 5. X-ray spectrometers; 6. Element mapping; 7. X-ray analysis (1); 8. X-ray analysis (2); 9. Sample preparation; Appendix; References; Index.

      Recently viewed products

      © 2026 Book Curl

        • American Express
        • Apple Pay
        • Diners Club
        • Discover
        • Google Pay
        • Maestro
        • Mastercard
        • PayPal
        • Shop Pay
        • Union Pay
        • Visa

        Login

        Forgot your password?

        Don't have an account yet?
        Create account