Electromigration and Electronic Device Degradation

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Hardback by Aris Christou Short Description:

Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details... Read more

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Publisher: John Wiley & Sons Inc
Publication Date: 07/02/1994
ISBN13: 9780471584896, 978-0471584896
ISBN10: 0471584894

Number of Pages: 343

Non Fiction , Technology, Engineering & Agriculture , Education