Description

Book Synopsis

Praise for the First Edition

The book goes beyond the usual textbook in that it provides more specific examples of real-world defect physics an easy reading, broad introductory overview of the field
?Materials Today

well written, with clear, lucid explanations
?Chemistry World

This revised edition provides the most complete, up-to-date coverage of the fundamental knowledge of semiconductors, including a new chapter that expands on the latest technology and applications of semiconductors. In addition to inclusion of additional chapter problems and worked examples, it provides more detail on solid-state lighting (LEDs and laser diodes). The authors have achieved a unified overview of dopants and defects, offering a solid foundation for experimental methods and the theory of defects in semiconductors.

Matthew D. McCluskey is a professor in the Department of Physics and Astronomy and Materials Science Program at Washington St

Trade Review

"The second edition of this textbook lays the groundwork for both the classical and modern developments in the theory of semiconductors. This book is significant both for its presentation of the basic principles of the theory of defects in semiconductors and for its exposition of recent developments in the field, such as LEDs and laser diodes."

--Christian Brosseau, OSA Fellow and professor of physics, Université de Bretagne Occidentale, Brest, France



Table of Contents

1. Semiconductor Basics 2. Defect Classifications 3. Interfaces and Devices 4. Crystal Growth and Doping 5. Electronic Properties 6. Vibrational Properties 7. Optical Properties 8. Thermal Properties 9. Electrical Measurements 10. Optical Spectroscopy 11. Particle-Beam Methods 12. Microscopy and Structural Characterization

Dopants and Defects in Semiconductors

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    £171.00

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    RRP £180.00 – you save £9.00 (5%)

    Order before 4pm tomorrow for delivery by Sat 27 Jun 2026.

    A Hardback by Eugene E. Haller, Eugene E. Haller

    15 in stock


      View other formats and editions of Dopants and Defects in Semiconductors by Eugene E. Haller

      Publisher: Taylor & Francis Ltd
      Publication Date: 2/28/2018 12:00:00 AM
      ISBN13: 9781138035195, 978-1138035195
      ISBN10: 113803519X

      Description

      Book Synopsis

      Praise for the First Edition

      The book goes beyond the usual textbook in that it provides more specific examples of real-world defect physics an easy reading, broad introductory overview of the field
      ?Materials Today

      well written, with clear, lucid explanations
      ?Chemistry World

      This revised edition provides the most complete, up-to-date coverage of the fundamental knowledge of semiconductors, including a new chapter that expands on the latest technology and applications of semiconductors. In addition to inclusion of additional chapter problems and worked examples, it provides more detail on solid-state lighting (LEDs and laser diodes). The authors have achieved a unified overview of dopants and defects, offering a solid foundation for experimental methods and the theory of defects in semiconductors.

      Matthew D. McCluskey is a professor in the Department of Physics and Astronomy and Materials Science Program at Washington St

      Trade Review

      "The second edition of this textbook lays the groundwork for both the classical and modern developments in the theory of semiconductors. This book is significant both for its presentation of the basic principles of the theory of defects in semiconductors and for its exposition of recent developments in the field, such as LEDs and laser diodes."

      --Christian Brosseau, OSA Fellow and professor of physics, Université de Bretagne Occidentale, Brest, France



      Table of Contents

      1. Semiconductor Basics 2. Defect Classifications 3. Interfaces and Devices 4. Crystal Growth and Doping 5. Electronic Properties 6. Vibrational Properties 7. Optical Properties 8. Thermal Properties 9. Electrical Measurements 10. Optical Spectroscopy 11. Particle-Beam Methods 12. Microscopy and Structural Characterization

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