Description
Book SynopsisDetails the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.
Table of ContentsThe role of transmission electron microscopy in characterising radiation damage. An introduction to the available contrast mechanisms and experimental techniques. Analysis of small centres of strain: the determination of loop morphologies. Analysis of small centres of strain: determination of the vacancy or interstitial natural of small clusters. Analysis of small centres of strain: counting and sizing small clusters. Characterisation of voids and bubbles. Techniques for imaging displacement cascades. High-resolution imaging of radiation damage. In-situ irradiation experiments. Applications of analytical techniques. Radiation damage in amorphous glass. Appendix: The Thompson tetrahdron. References. Index.
