Description

Book Synopsis

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.



Table of Contents
General Information, Substrate Noise in Mixed-Signal Ic’s in a Silicon Process, Efficient and Simple Compact Modeling of Interconnects, Electro-Thermal Modeling of Substrate, Substrate noise and parasites: towards 3D, General Conclusion, References, Index

Power Thermal Noise and Signal Integrity Issues

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Order before 4pm today for delivery by Thu 15 Jan 2026.

A Hardback by Yue Ma, Christian Gontrand

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    View other formats and editions of Power Thermal Noise and Signal Integrity Issues by Yue Ma

    Publisher: Taylor & Francis Ltd
    Publication Date: 28/03/2019
    ISBN13: 9780367023430, 978-0367023430
    ISBN10: 0367023431

    Description

    Book Synopsis

    As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.



    Table of Contents
    General Information, Substrate Noise in Mixed-Signal Ic’s in a Silicon Process, Efficient and Simple Compact Modeling of Interconnects, Electro-Thermal Modeling of Substrate, Substrate noise and parasites: towards 3D, General Conclusion, References, Index

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