Description
Book SynopsisProviding proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.
Table of ContentsINDUSTRIAL SECTORSAutomotive Applications of Scanning and Transmission Electron Microscopy, W.T. Donlon, A.E. Chen, J.W. Hangas, and M.C. Paputa PeckElectron Microscopy for the Pulp and Paper Industry, D.R. RothbardApplications of Electron Microscopy in Photographic Science and Technology,V.P. OleshkoCharacterization of Petroleum Catalysts by Electron Microscopy, I.Y. ChanApplications of Electron Microscopy for Defect Understanding in the Glass Industry, P.M. FennApplications of Electron Microscopy in the Semiconductor Industry: Challenges and Solutions for Specimen Preparation, Y. Xu and C. SchwappachElectron Imaging in Pharmaceutical Research and Development, S.J. Samuelsson and J.A. FagerlandElectron Microscopy in Mineral Processing, C.M. MacRae and P.R. MillerContributions of Microscopy to Advanced Industrial Materials and Processing, T. Malis, G.J. C. Carpenter, G.A. Botton, S. Dionne, and M.W. PhaneufMuseum Applications for SEM and X-Ray Microanalysis, A.V. KlausForensic Applications of Scanning Electron Microscopy with X-Ray Analysis, T.A. KubicINDUSTRIALLY IMPORTANT MATERIALSElectron Microscopy on Pigments, U. KolbPolymer Characterization Using Electron Microscopes, N. Yao and E.H. KungCarbon Nanotube and Its Application to Nanoelectronics, W.B. Choi and Y.H. LeeElectron Microscopy of Ceramic Materials, K.E. Sickafus and T.E. MitchellApplications of Electron Microscopy to High-Temperature Superconductors and Related Materials, J. Jiang and C. ChenCharacterization of CVD Diamond Defects by UHREM, D. DorignacStructure-Function Relationships of Mycorrhizal Symbioses Revealed by Electron Microscopy, H.B. Massicotte, L.H. Melville, and R.L. PetersonOTHER TOPICSPrinciples of Electron Microscopy and Related Techniques, D.J. SmithDigital Imaging in Electron Microscopy, L. Liang and Z.R. LiElectron Energy-Loss Spectroscopy and Energy-Filtered Electron Imaging, Z.L. WangElectron Crystallography: Structure Determination by HREM and Electron Diffraction, X. Zou and S. Hovm/llerIndex
