Description
Book SynopsisAtomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution.This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
Trade ReviewAtomic Force Microscopy is a great introduction to AFMs for beginners and, although light on theory, also serves as a good starting point for more serious users. * Udo D. Schwarz, Physics Today *
There is definitely room for a general book on AFM which concentrates on how to get the most from the instrument and teaches the beginner/moderately experienced user the 'tricks of the trade'. * Jamie Hobbs, Sheffield University, UK *
Atomic Force Microscopy is the manual that should accompany any Atomic Force Microscope. * Othmar Marti, University of Ulm, Germany *
I recommend this book to any reader who wants to enter the world of force microscopy. This book is easy to read, entertaining, with a practical approach. * Carmen Serra, Nanotechnology and Surface Analysis Service, University of Vigo, Spain *
Table of Contents1: Introduction 2: Instrumental Aspects of AFM 3: AFM Modes 4: Measuring AFM Images 5: Image Processing in AFM 6: Image Artifacts in AFM 7: Applications of AFM Appendix 1: AFM Standards and Calibration Specimens Appendix 2: AFM Software
