Description

Book Synopsis
Provides the reader with memory fundamentals as well as directions for future research. Examines memory history, current memory technology and offers a glimpse at the future of memories.

Table of Contents
The Strategic Nature of Semiconductor Memories.

The Basics of Memories: Market, Technology and Product.

Trends in Memory Applications.

Memory Device and Process Technology.

Basic Memory Architecture and Cell Structure.

Dynamic Random Access Memory Trends--4k to 256Mb.

Application-Specific DRAMs.

Trends in Static RAMs.

Future, Fast and Application-Specific SRAMs.

MOS ROMs, PROMs and EPLDs.

Field Alterable ROMs I: EPROM, OTP, and Flash Memories.

Field Alterable ROMs 2: EEPROM, EAROM, NV-RAM.

Packaging--Single, Module and Wafer Scale Integration.

Memory Electrical and Reliability Testing.

Yield, Cost and the Modern Factory.

Memory Trends in the Future.

Index.

Semiconductor Memories

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    A Hardback by Betty Prince

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      Publisher: John Wiley & Sons Inc
      Publication Date: 20/02/1995
      ISBN13: 9780471942955, 978-0471942955
      ISBN10: 0471942952

      Description

      Book Synopsis
      Provides the reader with memory fundamentals as well as directions for future research. Examines memory history, current memory technology and offers a glimpse at the future of memories.

      Table of Contents
      The Strategic Nature of Semiconductor Memories.

      The Basics of Memories: Market, Technology and Product.

      Trends in Memory Applications.

      Memory Device and Process Technology.

      Basic Memory Architecture and Cell Structure.

      Dynamic Random Access Memory Trends--4k to 256Mb.

      Application-Specific DRAMs.

      Trends in Static RAMs.

      Future, Fast and Application-Specific SRAMs.

      MOS ROMs, PROMs and EPLDs.

      Field Alterable ROMs I: EPROM, OTP, and Flash Memories.

      Field Alterable ROMs 2: EEPROM, EAROM, NV-RAM.

      Packaging--Single, Module and Wafer Scale Integration.

      Memory Electrical and Reliability Testing.

      Yield, Cost and the Modern Factory.

      Memory Trends in the Future.

      Index.

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