Search results for ""Author D Bissell""

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.ContentsData Collection and Graphical SummariesNumerical Data Summaries-Location and DispersionProbability and DistributionSampling, Estimation, and ConfidenceSample Tests of Hypothesis; "Significance Tests"Control Charts for Process Management and ImprovementControl Charts for Average and VariationControl Charts for "Single-Valued" ObservationsControl Charts for Attributes and EventsControl Charts: Problems and Special CasesCusum MethodsProcess Capability-Attributes, Events, and Normally Distributed DataCapability; Non-Normal DistributionsEvaluating the Precision of a Measurement System (Gauge Capability)Getting More from Control Chart DataSPC in "Non-Product" ApplicationsAppendices

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