Search results for ""Author Farid N. Najm""

A DEFINITIVE TEXT ON DEVELOPING CIRCUIT SIMULATORS Circuit Simulation gives a clear description of the numerical techniques and algorithms that are part of modern circuit simulators, with a focus on the most commonly used simulation modes: DC analysis and transient analysis. Tested in a graduate course on circuit simulation at the University of Toronto, this unique text provides the reader with sufficient detail and mathematical rigor to write his/her own basic circuit simulator. There is detailed coverage throughout of the mathematical and numerical techniques that are the basis for the various simulation topics, which facilitates a complete understanding of practical simulation techniques. In addition, Circuit Simulation: Explores a number of modern techniques from numerical analysis that are not synthesized anywhere else Covers network equation formulation in detail, with an emphasis on modified nodal analysis Gives a comprehensive treatment of the most relevant aspects of linear and nonlinear system solution techniques States all theorems without proof in order to maintain the focus on the end-goal of providing coverage of practical simulation methods Provides ample references for further study Enables newcomers to circuit simulation to understand the material in a concrete and holistic manner With problem sets and computer projects at the end of every chapter, Circuit Simulation is ideally suited for a graduate course on this topic. It is also a practical reference for design engineers and computer-aided design practitioners, as well as researchers and developers in both industry and academia.

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Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.

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