Tantalum and NiobiumBased Capacitors

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Hardback by Yuri Freeman Short Description:

Introduction.- Chap1: Major Degradation Mechanisms.- Chap2: Basic Technology.- Chap3: Applications.- Conclusion. Read more

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Publisher: Springer
Publication Date: 11/10/2017
ISBN13: 9783319678696, 978-3319678696
ISBN10: 3319678698

Non Fiction , Technology, Engineering & Agriculture , Education