Spectroscopic Ellipsometry: Principles and Applications

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Hardback by Hiroyuki Fujiwara Short Description:

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with... Read more

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Publisher: John Wiley & Sons Inc
Publication Date: 26/01/2007
ISBN13: 9780470016084, 978-0470016084
ISBN10: 0470016086

Number of Pages: 392

Non Fiction , Mathematics & Science , Education