Description
Book SynopsisComplete dependence on semiconductor vendors'' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices.
The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers.
Sponsored by:
IEEE Components, Packaging, and Manufacturing Technology So
Table of ContentsList of Contributors.
List of Acronyms.
Foreword.
Basics of Nonvolatile Semiconductor Memory Devices (G. Groeseneken, et al.).
Floating Gate Planar Devices (H. Lin & R. Ramaswami).
Floating Gate Nonplanar Devices (H. Wegener & W. Owen).
Floating Gate Flash Devices (M. Gill & S. Lai).
SONOS Nonvolatile Semiconductor Memories (M. White & F. Libsch).
Reliability and NVSM Reliability (Y. Hsia & V. Tyree).
Radiation Tolerance (G. Messenger).
Procurement Considerations (D. Sweetman).
Bibliography (W. Brown).
Index.
Editors' Biographies.
