Nanometer-scale Defect Detection Using Polarized Light
£138.95
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Hardback by Pierre-Richard Dahoo , Philippe Pougnet
Short Description:
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states... Read more
Publisher: ISTE Ltd and John Wiley & Sons IncPublication Date: 12/08/2016
ISBN13: 9781848219366, 978-1848219366
ISBN10: 1848219369
Number of Pages: 316
Non Fiction , Technology, Engineering & Agriculture , Education