Description

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

Nanometer-scale Defect Detection Using Polarized Light

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Hardback by Pierre-Richard Dahoo , Philippe Pougnet

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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states... Read more

    Publisher: ISTE Ltd and John Wiley & Sons Inc
    Publication Date: 12/08/2016
    ISBN13: 9781848219366, 978-1848219366
    ISBN10: 1848219369

    Number of Pages: 316

    Non Fiction , Technology, Engineering & Agriculture , Education

    Description

    This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

    Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

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