High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
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Hardback by Ullrich Pietsch , Vaclav Holy
Short Description:
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development... Read more
Publisher: Springer-Verlag New York Inc.Publication Date: 27/08/2004
ISBN13: 9780387400921, 978-0387400921
ISBN10: 0387400923
Number of Pages: 408
Non Fiction , Technology, Engineering & Agriculture , Education