Description

Book Synopsis

Since the publication of the first edition, miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology. This interdependence of scales has had profound practical implications.

Updated and expanded to reflect many new developments, Handbook of Surface and Nanometrology, Second Edition determines how the reduction in scale of size from macro to nano has affected all aspects of surface use and measurement. The book discusses how this shift has extended through characterization, standardization, manufacture, and performance. With nanotechnology now permeating the text, this edition covers new methods of production and measurement as well as new performance requirements.

Described as the father of digital metrology by the American Society for Precision Engineering, author David J. Whitehouse explores the range

Trade Review

Praise for the First Edition
Handbook of Surface and Nanometrology
contains a wealth of information for both practical and research engineers. For Taylor Hobson, the volume epitomises the nature of the art of surface metrology and instrument engineering, as could only be recorded through a lifetime of dedication to the subject. This book will give both guidance and food for thought for anyone interested in the subject at whatever level.
—Bruce Wilson, Taylor Hobson

The book is very useful to the colleagues of my Institute. It will be one of the best books in our library.
—Professor Yuri Chugui



Table of Contents

Introduction—Surface and Nanometrology. Characterization. Processing, Operations, and Simulations. Measurement Techniques. Standardization-Traceability-Uncertainty. Surfaces and Manufacture. Surface Geometry and Its Importance in Function. Surface Geometry, Scale of Size Effects, Nanometrology. General Comments. Glossary. Index.

Handbook of Surface and Nanometrology

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    A Hardback by David J. Whitehouse

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      View other formats and editions of Handbook of Surface and Nanometrology by David J. Whitehouse

      Publisher: Taylor & Francis Inc
      Publication Date: 20/12/2010
      ISBN13: 9781420082012, 978-1420082012
      ISBN10: 1420082019

      Description

      Book Synopsis

      Since the publication of the first edition, miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology. This interdependence of scales has had profound practical implications.

      Updated and expanded to reflect many new developments, Handbook of Surface and Nanometrology, Second Edition determines how the reduction in scale of size from macro to nano has affected all aspects of surface use and measurement. The book discusses how this shift has extended through characterization, standardization, manufacture, and performance. With nanotechnology now permeating the text, this edition covers new methods of production and measurement as well as new performance requirements.

      Described as the father of digital metrology by the American Society for Precision Engineering, author David J. Whitehouse explores the range

      Trade Review

      Praise for the First Edition
      Handbook of Surface and Nanometrology
      contains a wealth of information for both practical and research engineers. For Taylor Hobson, the volume epitomises the nature of the art of surface metrology and instrument engineering, as could only be recorded through a lifetime of dedication to the subject. This book will give both guidance and food for thought for anyone interested in the subject at whatever level.
      —Bruce Wilson, Taylor Hobson

      The book is very useful to the colleagues of my Institute. It will be one of the best books in our library.
      —Professor Yuri Chugui



      Table of Contents

      Introduction—Surface and Nanometrology. Characterization. Processing, Operations, and Simulations. Measurement Techniques. Standardization-Traceability-Uncertainty. Surfaces and Manufacture. Surface Geometry and Its Importance in Function. Surface Geometry, Scale of Size Effects, Nanometrology. General Comments. Glossary. Index.

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