Fundamentals of Electromigration-Aware Integrated Circuit Design

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Hardback by Jens Lienig , Matthias Thiele Short Description:

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the... Read more

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Publisher: Springer International Publishing AG
Publication Date: 07/03/2018
ISBN13: 9783319735573, 978-3319735573
ISBN10: 3319735578

Number of Pages: 159

Non Fiction , Technology, Engineering & Agriculture , Education