Description

Book Synopsis
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

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    A Paperback by Fred Stevie

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      Book details

      Publisher Momentum Press
      Published 15 September 2015
      ISBN-13 9781606505885
      978-1606505885
      Also in:
      Materials science

      Description

      Book Synopsis
      This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

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