Description
Book SynopsisA pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job.
Trade Review"Highly recommended for libraries serving undergraduate and graduate electrical engineering students and professional practitioners." (Choice, Vol. 38, No. 7, March 2001)
Table of ContentsDESIGN AND TEST.
Overview of Testing.
Defects, Failures, and Faults.
Design Representation.
VLSI Design Flow.
TEST FLOW.
Role of Simulation in Testing.
Automatic Test Pattern Generation.
Current Testing.
DESIGN FOR TESTABILITY.
Ad Hoc Test Techniques.
Scan-Path Design.
Boundary-Scan Testing.
Built-in Self-Test.
SPECIAL STRUCTURES.
Memory Testing.
Testing FPGAs and Microprocessors.
ADVANCED TOPICS.
Synthesis for Testability.
Testing SOCs.
Appendices.
Index.
