Description

This book, written by recognized experts in the field, is intended for designers of RF or microwave passive integrated circuits. It describes methods used for modeling passive circuits using the most common numerical analysis techniques (the method of moments, finite element methods, FDTD, TLM), and pays particular attention to propagation phenomena. Interconnections and packaging modeling are included, as well as an original method for multi-scale circuit modeling.

Characterization and measurement methods in the time and frequency domains are the subject of two very detailed chapters. Measurement errors using Vector Network Analyzer (VNA ) and appropriate corrections are detailed and the divergences between all the various parameters S, Z, Y, h, T, ABCD are given. Time domain reflectometry and its use are also covered in detail.

Passive RF Integrated Circuits: Modeling, Characterization and Measurement

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£138.95

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Hardback by Pierre Saguet

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This book, written by recognized experts in the field, is intended for designers of RF or microwave passive integrated circuits.... Read more

    Publisher: ISTE Ltd and John Wiley & Sons Inc
    Publication Date: 09/10/2009
    ISBN13: 9781848211759, 978-1848211759
    ISBN10: 1848211759

    Number of Pages: 288

    Non Fiction , Technology, Engineering & Agriculture , Education

    Description

    This book, written by recognized experts in the field, is intended for designers of RF or microwave passive integrated circuits. It describes methods used for modeling passive circuits using the most common numerical analysis techniques (the method of moments, finite element methods, FDTD, TLM), and pays particular attention to propagation phenomena. Interconnections and packaging modeling are included, as well as an original method for multi-scale circuit modeling.

    Characterization and measurement methods in the time and frequency domains are the subject of two very detailed chapters. Measurement errors using Vector Network Analyzer (VNA ) and appropriate corrections are detailed and the divergences between all the various parameters S, Z, Y, h, T, ABCD are given. Time domain reflectometry and its use are also covered in detail.

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