Description

Book Synopsis
This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.

Trade Review
`... provides an outstanding introduction for the microscopist seeking to make new use of this powerful simulation tool, as well as a great resource for established modelers looking to extend their knowledge... clearly written and strongly supported by practical examples throughout.' Radiation and Physical Chemistry

Table of Contents
Preface ; 1. An Introducton to Monte Carlo Methods ; 2. Constructing a Simulation ; 3. The Single Scattering Model ; 4. The Plural Scattering Model ; 5. Practical Applications of Monte Carlo Models ; 6. Backscattered Electrons ; 7. Charge Collection Microscopy and Cathodoluminescence ; 8. Secondary Electrons and Imaging ; 9. X-ray Production and Micro-Analysis ; 10. What Next in Monte Carlo Simulations?

Monte Carlo Modeling for Electron Microscopy and Microanalysis 9 Oxford Series in Optical and Imaging Sciences

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    A Hardback by David C. Joy

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      View other formats and editions of Monte Carlo Modeling for Electron Microscopy and Microanalysis 9 Oxford Series in Optical and Imaging Sciences by David C. Joy

      Publisher: Oxford University Press, USA
      Publication Date: 6/15/1995 12:00:00 AM
      ISBN13: 9780195088748, 978-0195088748
      ISBN10: 0195088743
      Also in:
      Computing 3D graphics and modelling Mathematics Probability and statistics Science & Nature Microscopy

      Description

      Book Synopsis
      This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.

      Trade Review
      `... provides an outstanding introduction for the microscopist seeking to make new use of this powerful simulation tool, as well as a great resource for established modelers looking to extend their knowledge... clearly written and strongly supported by practical examples throughout.' Radiation and Physical Chemistry

      Table of Contents
      Preface ; 1. An Introducton to Monte Carlo Methods ; 2. Constructing a Simulation ; 3. The Single Scattering Model ; 4. The Plural Scattering Model ; 5. Practical Applications of Monte Carlo Models ; 6. Backscattered Electrons ; 7. Charge Collection Microscopy and Cathodoluminescence ; 8. Secondary Electrons and Imaging ; 9. X-ray Production and Micro-Analysis ; 10. What Next in Monte Carlo Simulations?

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