Description

This book highlights principles and applications of electromagnetic compatibility (EMC). After introducing the basic concepts, research progress, standardizations and limitations of EMC, the book puts emphasis on presenting the generation mechanisms and suppression principles of conducted electromagnetic interference (EMI) noise, radiated EMI noise, and electromagnetic susceptibility (EMS) problems such as electrostatic discharge (ESD), electric fast transient (EFT) and surge. By showing EMC case studies and solved examples, the book provides effective solutions to practical engineering problems. Students and researchers will be able to use the book as practical reference for EMC-related measurements and problem- solution.

Electromagnetic Compatibility: Principles and Applications

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£54.99

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Paperback / softback by Yang Zhao , Wei Yan

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Short Description:

This book highlights principles and applications of electromagnetic compatibility (EMC). After introducing the basic concepts, research progress, standardizations and limitations... Read more

    Publisher: Springer Verlag, Singapore
    Publication Date: 23/12/2022
    ISBN13: 9789811664540, 978-9811664540
    ISBN10: 9811664544

    Number of Pages: 232

    Non Fiction , Mathematics & Science , Education

    • Tell a unique detail about this product5

    Description

    This book highlights principles and applications of electromagnetic compatibility (EMC). After introducing the basic concepts, research progress, standardizations and limitations of EMC, the book puts emphasis on presenting the generation mechanisms and suppression principles of conducted electromagnetic interference (EMI) noise, radiated EMI noise, and electromagnetic susceptibility (EMS) problems such as electrostatic discharge (ESD), electric fast transient (EFT) and surge. By showing EMC case studies and solved examples, the book provides effective solutions to practical engineering problems. Students and researchers will be able to use the book as practical reference for EMC-related measurements and problem- solution.

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