Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
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Hardback by Pierre-Richard Dahoo , Philippe Pougnet
Short Description:
To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research... Read more
Publisher: ISTE Ltd and John Wiley & Sons IncPublication Date: 12/02/2021
ISBN13: 9781786306401, 978-1786306401
ISBN10: 1786306409
Number of Pages: 256
Non Fiction , Technology, Engineering & Agriculture , Education