Refractionstafeln für Kreis Faden und PositionsMicrometer anwendbar in Polhöhen zwischen 32 90 NF.23.4

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A Hardback by Emanuel Kayser

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View other formats and editions of Refractionstafeln für Kreis Faden und PositionsMicrometer anwendbar in Polhöhen zwischen 32 90 NF.23.4 by Emanuel Kayser

Publisher: Antigonos Verlag
Publication Date: 07/11/2024
ISBN13: 9783386332750, 978-3386332750
ISBN10: