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Book Synopsis
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Radiation Effects And Soft Errors In Integrated

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A Hardback by Ronald D Schrimpf, Daniel M Fleetwood

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    View other formats and editions of Radiation Effects And Soft Errors In Integrated by Ronald D Schrimpf

    Publisher: World Scientific Publishing Co Pte Ltd
    Publication Date: 03/08/2004
    ISBN13: 9789812389404, 978-9812389404
    ISBN10: 9812389407
    Also in:
    Electronics: circuits and components

    Description

    Book Synopsis
    This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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