Description
Book SynopsisThis book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
Trade ReviewAn excellent book for graduate students and early career researchers ..., one of the best to review the present status of Materials Science. Strongly recommended. * Nobuo Tanaka, Nagoya University, Japan *
Very timely and of paramount importance to both students and senior researchers. * Peter Fischer, Lawrence Berkeley National Lab *
Comprehensive, well organized, and should appeal as a fundamental text to a wide range of first and second year undergraduates studying Materials Science, Engineering, Physics, Chemistry or Geology. * David Cardwell, University of Cambridge *
Materials characterization is at the core of what Materials Scientists and Engineers do, and this book strikes a fine balance between fundamentals and applications for the different techniques. * Juan Claudio Nino, University of Florida *
This is an excellent textbook for a course on the structural characterisation of materials. It could also find a place on the bookshelf of an experienced materials scientist wanting to be brought up to date on new techniques and their applications. * A.H. Harker, Contemporary Physics *
Table of Contents1: Introduction to materials characterization, analysis, and metrology 2: Atomic structure and spectra 3: Bonding and spectra of molecules and solids 4: Crystallography and diffraction 5: Probes: sources and their interactions with matter 6: Optics, optical methods, and microscopy 7: X-ray diffraction 8: Diffraction of electrons and neutrons 9: Transmission and analytical electron microscopy 10: Scanning electron microscopy 11: Scanning probe microscopy 12: Summary tables
