Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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A Paperback by R.F. Egerton
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View other formats and editions of Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM by R.F. Egerton
Publisher: Springer International Publishing AG
Publication Date: 30/05/2018
ISBN13: 9783319819860, 978-3319819860
ISBN10: 3319819860