Description

Book Synopsis
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Table of Contents
((short))
Basics
Thermodynamics
Mechanical Properties
Magnetic Properties
Optical Properties
Electronic Properties
Ferroelectric Properties
Soft Matter

((long))
I. Basics
Scanning Electron Microscopy (SEM)
Focused Ion Beam Microscopy (FIB)
Transmission Electron Microscopy (including HRTEM and STEM)
Camera Systems for Dynamic TEM Experiments
II. Thermodynamics
Growth Processes
Melting and Pre-melting
Chemical Reactions and Oxidation
Interface Kinetcs
Formation of Silicides from a-Si and metal layers
Formation of Surface Patterns observed by Reflection Electron Microscopy
III. Mechanical Properties
The FIB Platform
Mechanical Tests in the SEM
Strain Mapping by Image Correlation (SEM to HRTEM)
Dislocation Mechanisms
New Developments: In-situ Nanoindentation, AFM, and STM Experiments in the TEM
IV. Magnetic Properties
Lorentz-Microscopy
Dynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEM
V. Optical Properties
Cathodoluminiscence in SEM and TEM
Optical Properties of Nanotubes
VI. Electronic Properties
EBIC (SEM) and Potential Contrast
Electromigration (SEM, TEM)
VII. Ferroelectric Properties
Ferroelectric Domains
VIII. Soft Matter
Experiments using Wet-cells (SEM, ESEM, biological samples and materials)
Structure Determination of Soft Matter using In-situ Techniques

In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

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    A Hardback by Gerhard Dehm, James M. Howe, Josef Zweck

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      View other formats and editions of In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science by Gerhard Dehm

      Publisher: Wiley-VCH Verlag GmbH
      Publication Date: 26/04/2012
      ISBN13: 9783527319732, 978-3527319732
      ISBN10:

      Description

      Book Synopsis
      Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
      real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
      on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

      Table of Contents
      ((short))
      Basics
      Thermodynamics
      Mechanical Properties
      Magnetic Properties
      Optical Properties
      Electronic Properties
      Ferroelectric Properties
      Soft Matter

      ((long))
      I. Basics
      Scanning Electron Microscopy (SEM)
      Focused Ion Beam Microscopy (FIB)
      Transmission Electron Microscopy (including HRTEM and STEM)
      Camera Systems for Dynamic TEM Experiments
      II. Thermodynamics
      Growth Processes
      Melting and Pre-melting
      Chemical Reactions and Oxidation
      Interface Kinetcs
      Formation of Silicides from a-Si and metal layers
      Formation of Surface Patterns observed by Reflection Electron Microscopy
      III. Mechanical Properties
      The FIB Platform
      Mechanical Tests in the SEM
      Strain Mapping by Image Correlation (SEM to HRTEM)
      Dislocation Mechanisms
      New Developments: In-situ Nanoindentation, AFM, and STM Experiments in the TEM
      IV. Magnetic Properties
      Lorentz-Microscopy
      Dynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEM
      V. Optical Properties
      Cathodoluminiscence in SEM and TEM
      Optical Properties of Nanotubes
      VI. Electronic Properties
      EBIC (SEM) and Potential Contrast
      Electromigration (SEM, TEM)
      VII. Ferroelectric Properties
      Ferroelectric Domains
      VIII. Soft Matter
      Experiments using Wet-cells (SEM, ESEM, biological samples and materials)
      Structure Determination of Soft Matter using In-situ Techniques

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