Description
Book SynopsisThis book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. It covers the usefulness of seeing atoms in the semiconductor industry, in materials science, in condensed matter physics, and in biology.
Trade Review... essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques. * Jian-Min Zuo, Microscopy & Microanalysis *
Table of Contents1: Preliminaries 2: Electron Optics 3: Wave Optics 4: Coherence and Fourier Optics 5: Imaging Thin Crystals and their Defects 6: Imaging Molecules: Radiation Damage 7: Image Processing, Super-Resolution, Diffractive Imaging 8: STEM and Z-contrast 9: Electron Sources and Detectors 10: Measurement of Electron-Optical Parameters 11: Instabilities and the Microscope Environment 12: Experimental Methods 13: Associated Techniques and Software Resources Appendices
