Description
Book SynopsisThe 2019 edition of
ASM Handbook, Volume 10: Materials Characterization provides detailed technical information that will enable readers to select and use analytical techniques that are appropriate for their problem. Each article describing a characterization technique begins with an overview of the method in simplified terms and lists common applications as well as limitations. Sample size, form, and special preparation requirements are listed upfront to help readers quickly decide if the techniques are appropriate to solve their problem. Tables and charts listing the most common characterization methods for different classes of materials are included in the beginning of the handbook. The tables give information on whether the technique is suitable for elemental analysis, qualitative analysis, surface analysis, or alloy verification. The articles also describe material characterization in general terms according to material type and serve as a jumping off point to the more specific technique articles.
Table of Contents
- INTRODUCTION TO MATERIALS ANALYSIS METHODS
- Introduction to Material Analysis and Characterization
- Characterization of Metals and Alloys
- Semiconductor Characterization
- Characterization of Glasses and Ceramics
- Introduction to Characterization of Organic Solids and Organic Liquids
- Introduction to Characterization of Powders
- SPECTROSCOPY
- Optical Emission Spectroscopy
- Atomic Absorption Spectroscopy
- Inductively Coupled Plasma Optical Emission Spectroscopy
- Infrared Spectroscopy
- Raman Spectroscopy
- Magnetic Resonance Spectroscopy
- MASS AND ION SPECTROMETRY
- Solid Analysis by Mass Spectrometry
- Gas Analysis by Mass Spectrometry
- Glow Discharge Mass Spectrometry
- Inductively Coupled Plasma Mass Spectrometry
- Rutherford Backscattering Spectrometry
- Low-Energy Ion-Scattering Spectroscopy
- CHEMICAL ANALYSIS AND SEPARATION TECHNIQUES
- Calibration and Experimental Uncertainty
- Chemical Spot Tests; Presumptive Tests
- Classical Wet Analytical Chemistry
- Gas Chromatography
- Gas Chromatography Mass Spectrometry (GC-MS)
- Liquid Chromatography
- Ion Chromatography
- Electrochemical Methods
- Neutron Activation Analysis
- THERMAL ANALYSIS
- Differential Scanning Calorimetry
- Thermogravimetric Analysis
- Dynamic Mechanical Analysis
- Thermomechanical Analysis
- X-RAY ANALYSIS
- X-Ray Spectroscopy
- Extended X-Ray Absorption Fine Structure
- Particle Induced X-Ray Emission
- Mossbauer Spectroscopy
- X-RAY AND NEUTRON DIFFRACTION
- Introduction to Diffraction Methods
- X-Ray Powder Diffraction
- Single-Crystal X-Ray Diffraction
- Micro X-Ray Diffraction
- X-Ray Diffraction Residual Stress Techniques
- X-Ray Topography
- Synchrotron X-Ray Diffraction Applications
- Neutron Diffraction
- LIGHT OPTICAL METALLOGRAPHY
- Light Optical Metallography
- Quantitative Metallography
- MICROSCOPY AND MICROANALYSIS
- Scanning Electron Microscopy
- Crystallographic Analysis by Electron Backscatter Diffraction in the Scanning Electron Microscope
- Transmission Electron Microscopy
- Electron Probe X-ray Microanalysis
- Focused Ion Beam Instruments
- SURFACE ANALYSIS
- Introduction to Surface Analysis
- Auger Electron Spectroscopy
- Low Energy Electron Diffraction
- Introduction to Scanning Probe Microscopy
- Atomic Force Microscopy
- Secondary Ion Mass Spectroscopy
- X-Ray Photoelectron Spectroscopy
- Thermal Desorption Spectroscopy
- REFERENCE INFORMATION
- Glossary of Terms
