Applications et métrologie à l'échelle nanométrique 2: systèmes de mesure, ingénierie quantique et méthodes d'optimisation fiabiliste

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Paperback / softback by Pierre Richard Dahoo , Philippe Pougnet Short Description:

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Publisher: Hermes Science Publishing Ltd
Publication Date: 01/12/2021
ISBN13: 9781784057947, 978-1784057947
ISBN10: 1784057940

Number of Pages: 232