Description

Book Synopsis
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.

. . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering.
Dev G. Raheja, Quality and Reliability Engineering International

. . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently.
Journal of the Royal Statistical Society

A benchmark text in

Trade Review
"…an essential resource for an statistician involved in product development and testing...available in an attractive and reasonably priced format." (Technometrics, August 2005)

"Researchers in insulation and engineers in general...will find this an outstanding reference book that will be used constantly." (IEEE Electrical Insulation Magazine, May/June 2005)



Table of Contents
Preface.

1. Introduction and Background.

2. Models for Life Tests with Constant Stress.

3. Graphical Data Analysis.

4. Complete Data and Least Squares Analyses.

5. Censored Data and Maximum Likelihood Methods.

6. Test Plans.

7. Competing Failure Modes and Size Effect.

8. Least-Squares Comparisons for Complete Data.

9. Maximum Likelihood Comparisons for Censored and Other Data.

10. Models and Data Analyses for Step and Varying Stress.

11. Accelerated Degradation.

Appendix A. Statistical Tables.

References.

Index.

Accelerated Testing

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    £118.76

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    Order before 4pm tomorrow for delivery by Tue 7 Jul 2026.

    A Paperback / softback by Wayne B. Nelson

      Trusted by thousands of customers. See 2,385+ Customer Reviews

      View other formats and editions of Accelerated Testing by Wayne B. Nelson

      Publisher: John Wiley & Sons Inc
      Publication Date: 05/10/2004
      ISBN13: 9780471697367, 978-0471697367
      ISBN10: 0471697362
      Also in:
      Mathematics

      Description

      Book Synopsis
      The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.

      . . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering.
      Dev G. Raheja, Quality and Reliability Engineering International

      . . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently.
      Journal of the Royal Statistical Society

      A benchmark text in

      Trade Review
      "…an essential resource for an statistician involved in product development and testing...available in an attractive and reasonably priced format." (Technometrics, August 2005)

      "Researchers in insulation and engineers in general...will find this an outstanding reference book that will be used constantly." (IEEE Electrical Insulation Magazine, May/June 2005)



      Table of Contents
      Preface.

      1. Introduction and Background.

      2. Models for Life Tests with Constant Stress.

      3. Graphical Data Analysis.

      4. Complete Data and Least Squares Analyses.

      5. Censored Data and Maximum Likelihood Methods.

      6. Test Plans.

      7. Competing Failure Modes and Size Effect.

      8. Least-Squares Comparisons for Complete Data.

      9. Maximum Likelihood Comparisons for Censored and Other Data.

      10. Models and Data Analyses for Step and Varying Stress.

      11. Accelerated Degradation.

      Appendix A. Statistical Tables.

      References.

      Index.

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