{"product_id":"thin-film-analysis-by-x-ray-scattering-9783527310524","title":"Thin Film Analysis by X-Ray Scattering","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eWith contributions by Paul F. Fewster and Christoph Genzel\u003cbr\u003e \u003cbr\u003e While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.\u003cbr\u003e Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTrade Review\u003c\/b\u003e\u003cbr\u003e\"... this book should prove very useful to anyone...\"\u003cbr\u003e Material Characterization \u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003e\u003cp\u003ePreface ix\u003c\/p\u003e \u003cp\u003eSymbols xv\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1 Principles of X-ray Diffraction 1\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1 The Basic Phenomenon 1\u003c\/p\u003e \u003cp\u003e1.2 The θ\/2θ Scan 11\u003c\/p\u003e \u003cp\u003e1.3 Intensity of Bragg Ref lections 14\u003c\/p\u003e \u003cp\u003e1.3.1 Atomic Form Factors 17\u003c\/p\u003e \u003cp\u003e1.3.2 Structure Factor 19\u003c\/p\u003e \u003cp\u003e1.3.3 Multiplicity 24\u003c\/p\u003e \u003cp\u003e1.3.4 Geometry Factor 25\u003c\/p\u003e \u003cp\u003e1.3.5 Preferred Orientation (Texture) 25\u003c\/p\u003e \u003cp\u003e1.3.6 Polarization Factor 26\u003c\/p\u003e \u003cp\u003e1.3.7 Absorption Factor 26\u003c\/p\u003e \u003cp\u003e1.3.8 Integration of the Interference Function 29\u003c\/p\u003e \u003cp\u003e1.4 Applications 37\u003c\/p\u003e \u003cp\u003eExercises 39\u003c\/p\u003e \u003cp\u003eReferences 41\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2 Identification of Chemical Phases 43\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Histogram-Based Techniques 43\u003c\/p\u003e \u003cp\u003e2.2 Linear Attenuation Coefficient µ 55\u003c\/p\u003e \u003cp\u003e2.3 Determination and Interpretation of the µt Product 60\u003c\/p\u003e \u003cp\u003e2.4 Analysis of Phase Mixtures 66\u003c\/p\u003e \u003cp\u003e2.5 Amorphous Thin Films 70\u003c\/p\u003e \u003cp\u003e2.6 Accurate Determination of Lattice Parameter 74\u003c\/p\u003e \u003cp\u003e2.7 Applications 80\u003c\/p\u003e \u003cp\u003eExercises 81\u003c\/p\u003e \u003cp\u003eReferences 83\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3 Line Profile Analysis 85\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1 Model Functions and Peak Parameters 86\u003c\/p\u003e \u003cp\u003e3.2 Instrumental Line Profile 97\u003c\/p\u003e \u003cp\u003e3.3 Deconvolution by Fourier Techniques 101\u003c\/p\u003e \u003cp\u003e3.4 Ref lection Broadening by Small Crystallite Size Only 107\u003c\/p\u003e \u003cp\u003e3.4.1 Scherrer Equation 108\u003c\/p\u003e \u003cp\u003e3.4.2 Column Height Distribution 111\u003c\/p\u003e \u003cp\u003e3.4.3 Crystallite Shapes Other Than Cubes 112\u003c\/p\u003e \u003cp\u003e3.4.4 Determination of the Column Height Distribution Function 115\u003c\/p\u003e \u003cp\u003e3.4.5 Determination of the Crystallite Size Distribution Function 118\u003c\/p\u003e \u003cp\u003e3.5 Concomitant Occurrence of Size and Strain Broadening 120\u003c\/p\u003e \u003cp\u003e3.5.1 Analysis According to Williamson and Hall 122\u003c\/p\u003e \u003cp\u003e3.5.2 Method of Warren and Averbach 126\u003c\/p\u003e \u003cp\u003e3.5.3 Single-Line Analysis 129\u003c\/p\u003e \u003cp\u003e3.5.4 Techniques of Whole-Pattern Fitting 130\u003c\/p\u003e \u003cp\u003e3.6 Applications 134\u003c\/p\u003e \u003cp\u003eExercises 136\u003c\/p\u003e \u003cp\u003eReferences 138\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4 Grazing Incidence Configurations 143\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 Grazing Incidence X-ray Diffraction (GIXRD) 148\u003c\/p\u003e \u003cp\u003e4.2 Penetration Depth and Information Depth 155\u003c\/p\u003e \u003cp\u003e4.3 Depth-Dependent Properties 158\u003c\/p\u003e \u003cp\u003e4.4 Refractive Index for X-rays 160\u003c\/p\u003e \u003cp\u003e4.5 Total External Ref lection and Critical Angle 161\u003c\/p\u003e \u003cp\u003e4.6 X-ray Ref lectivity (XRR) 165\u003c\/p\u003e \u003cp\u003e4.6.1 Ref lectivity of a Substrate 166\u003c\/p\u003e \u003cp\u003e4.6.2 Ref lectivity of a Single Layer 168\u003c\/p\u003e \u003cp\u003e4.6.3 Ref lectivity of Multilayers and Superlattices 171\u003c\/p\u003e \u003cp\u003e4.7 Grazing Incidence Diffraction (GID) 175\u003c\/p\u003e \u003cp\u003e4.8 Applications 177\u003c\/p\u003e \u003cp\u003eExercises 179\u003c\/p\u003e \u003cp\u003eReferences 181\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5 Texture and Preferred Orientation 183\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 Texture Factors 188\u003c\/p\u003e \u003cp\u003e5.2 Pole Figures 191\u003c\/p\u003e \u003cp\u003e5.3 Measurement of Pole Figures 195\u003c\/p\u003e \u003cp\u003e5.4 Directions, Orientations and Inverse Pole Figures 200\u003c\/p\u003e \u003cp\u003e5.5 Fiber Textures or Layer Textures 204\u003c\/p\u003e \u003cp\u003e5.5.1 Harmonic Method 204\u003c\/p\u003e \u003cp\u003e5.5.2 Whole Pattern Techniques 207\u003c\/p\u003e \u003cp\u003e5.5.3 Rocking Curves (ω Scans) 211\u003c\/p\u003e \u003cp\u003e5.6 Biaxial and Fully General Textures 216\u003c\/p\u003e \u003cp\u003e5.6.1 Azimuthal Scans (φ Scans) 218\u003c\/p\u003e \u003cp\u003e5.6.2 General Orientation Distribution 220\u003c\/p\u003e \u003cp\u003e5.6.3 Determination of Fully General Texture 225\u003c\/p\u003e \u003cp\u003e5.7 Depth Dependence of Thin-Film Textures 228\u003c\/p\u003e \u003cp\u003e5.8 Applications 230\u003c\/p\u003e \u003cp\u003eExercises 234\u003c\/p\u003e \u003cp\u003eReferences 235\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6 Residual Stress Analysis 239\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eMario Birkholz and Christoph Genzel\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e6.1 Ceiiinnosssttuv 241\u003c\/p\u003e \u003cp\u003e6.2 Fundamental Equation of XSA 246\u003c\/p\u003e \u003cp\u003e6.3 Measurement of d ψ Distributions \u003ci\u003e249\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e6.4 Diffraction Elastic Constants (DECs) s 1 and 1\/2s 2 \u003ci\u003e258\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e6.5 Grain Interaction Models 261\u003c\/p\u003e \u003cp\u003e6.6 The Effect of Texture 265\u003c\/p\u003e \u003cp\u003e6.7 Classification of Stresses 268\u003c\/p\u003e \u003cp\u003e6.7.1 Classification by Dimension 268\u003c\/p\u003e \u003cp\u003e6.7.2 Residual Stresses in Multiphase Materials 269\u003c\/p\u003e \u003cp\u003e6.7.3 Origin of Residual Stresses: Extrinsic and Intrinsic Stresses 271\u003c\/p\u003e \u003cp\u003e6.8 Effect of Residual Stress Gradients 273\u003c\/p\u003e \u003cp\u003e6.8.1 General Considerations 273\u003c\/p\u003e \u003cp\u003e6.8.2 The Biaxial Stress State 274\u003c\/p\u003e \u003cp\u003e6.9 Detection of Residual Stress Gradients in Thin Films 276\u003c\/p\u003e \u003cp\u003e6.9.1 Basic Relations 276\u003c\/p\u003e \u003cp\u003e6.9.2 X-ray Penetration Depth for the General Case of Asymmetric Diffraction 278\u003c\/p\u003e \u003cp\u003e6.9.3 Special Methods for X-ray Stress Gradient Analysis 281\u003c\/p\u003e \u003cp\u003e6.9.4 Grazing-Incidence Diffraction (GID) 282\u003c\/p\u003e \u003cp\u003e6.9.5 The Scattering Vector Method 284\u003c\/p\u003e \u003cp\u003e6.9.6 Realization of H Mode on a Four-Circle Diffractometer 286\u003c\/p\u003e \u003cp\u003e6.10 Applications 289\u003c\/p\u003e \u003cp\u003eExercises 291\u003c\/p\u003e \u003cp\u003eReferences 291\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7 High-Resolution X-ray Diffraction 297\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eMario Birkholz and Paul F. Fewster\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e7.1 Strain, Strain Relaxation and Composition in Epitaxial Layers 303\u003c\/p\u003e \u003cp\u003e7.2 High-Resolution Rocking Curves 306\u003c\/p\u003e \u003cp\u003e7.3 Mosaicity and Extinction 314\u003c\/p\u003e \u003cp\u003e7.4 Dynamical Theory of Ewald and Extensions 319\u003c\/p\u003e \u003cp\u003e7.5 High-Resolution Rocking Curves and Profiles from Layer Structures 324\u003c\/p\u003e \u003cp\u003e7.6 Reciprocal Space Mapping 332\u003c\/p\u003e \u003cp\u003e7.7 Diffuse Scattering 337\u003c\/p\u003e \u003cp\u003e7.8 Extensions to High-Resolution Diffraction 338\u003c\/p\u003e \u003cp\u003eExercises 339\u003c\/p\u003e \u003cp\u003eReferences 340\u003c\/p\u003e","brand":"Wiley-VCH Verlag GmbH","offers":[{"title":"Default Title","offer_id":51742968054103,"sku":"9783527310524","price":130.86,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9783527310524.jpg?v=1758387706","url":"https:\/\/bookcurl.com\/products\/thin-film-analysis-by-x-ray-scattering-9783527310524","provider":"Book Curl","version":"1.0","type":"link"}