{"product_id":"surface-and-thin-film-analysis-a-compendium-of-principles-instrumentation-and-applications-9783527320479","title":"Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eSurveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.\u003cbr\u003e \u003cbr\u003e From a Review of the First Edition (edited by Bubert and Jenett)\u003cbr\u003e \"... a useful resource...\"\u003cbr\u003e (Journal of the American Chemical Society)\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTrade Review\u003c\/b\u003e\u003cbr\u003e\"...a useful resource...\" Journal of the American Chemical Society\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003ePreface\u003cbr\u003e INTRODUCTION\u003cbr\u003e \u003cbr\u003e PART I: Electron Detection\u003cbr\u003e \u003cbr\u003e X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information and Chemical Shifts\u003cbr\u003e Quantification, Depth Profiling, and Imaging\u003cbr\u003e The Auger Parameter\u003cbr\u003e Applications\u003cbr\u003e Ultraviolet Photoelectron Spectroscopy (UPS)\u003cbr\u003e AUGER ELECTRON SPECTROSCOPY (AES)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information\u003cbr\u003e Quantification and Depth Profiling\u003cbr\u003e Applications\u003cbr\u003e Scanning Auger Microscopy (SAM)\u003cbr\u003e ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS) AND ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPY (EFTEM)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Qualitative Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Imaging of Element Distribution\u003cbr\u003e Summary\u003cbr\u003e LOW-ENERGY ELECTRON DIFFRACTION (LEED)\u003cbr\u003e Principles and History\u003cbr\u003e Qualitative Information\u003cbr\u003e Quantitative Structural Information\u003cbr\u003e Low-Energy Electron Microscopy\u003cbr\u003e OTHER ELECTRON-DETECTING TECHNIQUES\u003cbr\u003e Ion (Excited) Auger Electron Spectroscopy (IAES)\u003cbr\u003e Ion Neutralization Spectroscopy (INS)\u003cbr\u003e Inelastic Electron Tunneling Spectroscopy (IETS)\u003cbr\u003e \u003cbr\u003e PART II: Ion Detection\u003cbr\u003e \u003cbr\u003e STATIC SECONDARY ION MASS SPECTROMETRY (SSIMS)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Quantification\u003cbr\u003e Spectral Information\u003cbr\u003e Applications\u003cbr\u003e DYNAMIC SECONDARY ION MASS SPECTROMETRY (SIMS)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Mass Spectra\u003cbr\u003e Depth Profiles\u003cbr\u003e Imaging\u003cbr\u003e Three-Dimensional (3-D)-SIMS\u003cbr\u003e Applications\u003cbr\u003e ELECTRON-IMPACT (EI) SECONDARY NEUTRAL MASS SPECTROMETRY (SNMS)\u003cbr\u003e Introduction\u003cbr\u003e General Principles of SNMS\u003cbr\u003e Instrumentation and Methods\u003cbr\u003e Spectral Information and Quantification\u003cbr\u003e Element Depth Profiling\u003cbr\u003e Applications\u003cbr\u003e LASER SECONDARY NEUTRAL MASS SPECTROMETRY (LASER-SNMS)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Applications\u003cbr\u003e RUTHERFORD BACKSCATTERING SPECTROSCOPY (RBS)\u003cbr\u003e Introduction\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Figures of Merit\u003cbr\u003e Applications\u003cbr\u003e Related Techniques\u003cbr\u003e LOW-ENERGY ION SCATTERING (LEIS)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e LEIS Information\u003cbr\u003e Quantification\u003cbr\u003e Applications of LEIS\u003cbr\u003e ELASTIC RECOIL DETECTION ANALYSIS (ERDA)\u003cbr\u003e Introduction\u003cbr\u003e Fundamentals\u003cbr\u003e Particle Identification Methods\u003cbr\u003e Equipment\u003cbr\u003e Data Analysis\u003cbr\u003e Sensitivity and Depth Resolution\u003cbr\u003e Applications\u003cbr\u003e NUCLEAR REACTION ANALYSIS (NRA)\u003cbr\u003e Introduction\u003cbr\u003e Principles\u003cbr\u003e Equipment and Depth Resolution\u003cbr\u003e Applications\u003cbr\u003e FIELD ION MICROSCOPY (FIM) AND ATOM PROBE (AP)\u003cbr\u003e Introduction\u003cbr\u003e Principles and Instrumentation\u003cbr\u003e Applications\u003cbr\u003e OTHER ION-DETECTING TECHNIQUES\u003cbr\u003e Desorption Methods\u003cbr\u003e Glow-Discharge Mass Spectroscopy (GD-MS)\u003cbr\u003e Fast-Atom Bombardment Mass Spectroscopy (FABMS)\u003cbr\u003e \u003cbr\u003e PART III: Photon Detection\u003cbr\u003e \u003cbr\u003e TOTAL-REFLECTION X-RAY DLUORESCENCE (TXRF) ANALYSIS\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Applications\u003cbr\u003e ENERGY-DISPERSIVE X-RAY SPECTROSCOPY (EDXS)\u003cbr\u003e Principles\u003cbr\u003e Practical Aspects of X-Ray Microanalysis and Instrumentation\u003cbr\u003e Qualitative Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Imaging and Element Distribution\u003cbr\u003e Summary\u003cbr\u003e GRAZING INCIDENCE X-RAY METHODS FOR NEAR-SURFACE STRUCTURAL STUDIES\u003cbr\u003e Principles\u003cbr\u003e Experimental Techniques and Data Analysis\u003cbr\u003e Applications\u003cbr\u003e GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GD-OES)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Depth Profiling\u003cbr\u003e Applications\u003cbr\u003e SURFACE ANALYSIS BY LASER ABLATION\u003cbr\u003e Introduction\u003cbr\u003e Instrumentation\u003cbr\u003e Depth Profiling\u003cbr\u003e Near-Field Ablation\u003cbr\u003e Conclusion\u003cbr\u003e ION BEAM SPECTROCHEMICAL ANALYSIS (IBSCA)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral and Analytical Information\u003cbr\u003e Quantitative Analysis by IBSCA\u003cbr\u003e Applications\u003cbr\u003e REFLECTION ABSORPTION IR SPECTROSCOPY (RAIRS)\u003cbr\u003e Instrumentation\u003cbr\u003e Principles\u003cbr\u003e Applications\u003cbr\u003e Related Techniques\u003cbr\u003e SURFACE RAMAN SPECTROSCOPY\u003cbr\u003e Principles\u003cbr\u003e Surface-Enhanced Raman Scattering (SERS)\u003cbr\u003e Instrumentation\u003cbr\u003e Spectral Information\u003cbr\u003e Quantification\u003cbr\u003e Applications\u003cbr\u003e Nonlinear Optical Spectroscopy \u003cbr\u003e UV-VIS-IR ELLIPSOMETRY (ELL)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Applications\u003cbr\u003e SUM FREQUENCY GENERATION (SFG) SPECTROSCOPY\u003cbr\u003e Introduction to SFG Spectroscopy\u003cbr\u003e SFG Theory\u003cbr\u003e SFG Instrumentation and Operation Modes\u003cbr\u003e Applications of SFG Spectroscopy and Selected Case Studies\u003cbr\u003e Conclusion\u003cbr\u003e OTHER PHOTON-DETECTING TECHNIQUES\u003cbr\u003e Appearance Potential Methods\u003cbr\u003e Inverse Photoemission Spectroscopy (IPES) and Bremsstrahlung\u003cbr\u003e \u003cbr\u003e PART IV: Scanning Probe Microscopy\u003cbr\u003e \u003cbr\u003e INTRODUCTION\u003cbr\u003e ATOMIC FORCE MICROSCOPY (AFM)\u003cbr\u003e Principles\u003cbr\u003e Further Modes of AFM Operations\u003cbr\u003e Instrumentation\u003cbr\u003e Applications\u003cbr\u003e SCANNING TUNNELING MICROSCOPY (STM)\u003cbr\u003e Principles\u003cbr\u003e Instrumentation\u003cbr\u003e Lateral and Spectroscopy Information\u003cbr\u003e Applications\u003cbr\u003e SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)\u003cbr\u003e Introduction\u003cbr\u003e Instrumentation and Operation\u003cbr\u003e SNOM Applications\u003cbr\u003e Outlook\u003cbr\u003e APPENDIX\u003cbr\u003e Summary and Comparison of Techniques\u003cbr\u003e Surface and Thin-Film Analytical Equipment Suppliers\u003cbr\u003e","brand":"Wiley-VCH Verlag GmbH","offers":[{"title":"Default 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