{"product_id":"process-improvement-in-the-electronics-industry-24-wiley-series-in-systems-engineering-and-management-9780471209577","title":"Process Improvement in the Electronics Industry","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eDescribes a systematic approach to continuous process improvement through process capability studies, on-line and off-line design of experiments and statistical process control in the electronics and semiconductor industries.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTrade Review\u003c\/b\u003e\u003cbr\u003e\"...well written and covers, in a useful fashion, an extremely wide range of relevant subjects.\" (\u003ci\u003eTechnometrics\u003c\/i\u003e, Vol. 45, No. 4, November 2003)\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003ePreface.\u003cbr\u003e \u003cbr\u003e Acknowledgment.\u003cbr\u003e \u003cbr\u003e PART I: THE HUMAN SIDE OF PROCESS IMPROVEMENT.\u003cbr\u003e \u003cbr\u003e The Concepts of Process Improvement.\u003cbr\u003e \u003cbr\u003e Improving the Management Process.\u003cbr\u003e \u003cbr\u003e Systems and Systems Thinking.\u003cbr\u003e \u003cbr\u003e Creativity and Innovation.\u003cbr\u003e \u003cbr\u003e Some Basic Concepts of Variation.\u003cbr\u003e \u003cbr\u003e PART II: PROCESS CONTROL AND CAPABILITY STUDIES.\u003cbr\u003e \u003cbr\u003e Some Important Probability Distributions.\u003cbr\u003e \u003cbr\u003e Statistical Process Control.\u003cbr\u003e \u003cbr\u003e Measurement and Inspection Capability Studies.\u003cbr\u003e \u003cbr\u003e Process Capability Study.\u003cbr\u003e \u003cbr\u003e Working with Skewed Distributions.\u003cbr\u003e \u003cbr\u003e Engineering Specifications.\u003cbr\u003e \u003cbr\u003e Zero Defects Process Capability.\u003cbr\u003e \u003cbr\u003e Managing Sampling Systems in a Low ppm Environment.\u003cbr\u003e \u003cbr\u003e PART III: OFF-LINE AND ON-LINE DESIGN OF EXPERIMENTS.\u003cbr\u003e \u003cbr\u003e Off-Line Design of Experiments.\u003cbr\u003e \u003cbr\u003e On-Line Design of Experiments.\u003cbr\u003e \u003cbr\u003e APPENDICES. \u003cbr\u003e \u003cbr\u003e Appendix A: The Effect of Tampering with the Process.\u003cbr\u003e \u003cbr\u003e Appendix B: Factors for Constructing Control Charts.\u003cbr\u003e \u003cbr\u003e Appendix C: Area Under Normal Distribution (Z Table).\u003cbr\u003e \u003cbr\u003e Appendix D: Tables for Testing Skewness and Kurtosis.\u003cbr\u003e \u003cbr\u003e Appendix E: Percentage Points of the F Distribution.\u003cbr\u003e \u003cbr\u003e Appendix F: Orthogonal Arrays.\u003cbr\u003e \u003cbr\u003e Appendix G: Omega Transformation Table.\u003cbr\u003e \u003cbr\u003e Appendix H: Percentage Points of the t Distribution.\u003cbr\u003e \u003cbr\u003e Appendix I: Percentage Points of the x? Distribution.\u003cbr\u003e \u003cbr\u003e Appendix J: Cumulative Poisson Distribution.\u003cbr\u003e \u003cbr\u003e Appendix K: Supporting Theory for the CCC Chart and the Process Rejection Sampling Plan.\u003cbr\u003e \u003cbr\u003e Appendix L: Value of e?-x.\u003cbr\u003e \u003cbr\u003e Appendix M: One-Sided and Two-Sided Statistical Tolerance Intervals.\u003cbr\u003e \u003cbr\u003e Appendix N: A Quick Method to Design the OC and AOQ Curves for c = 0 Sampling Plans.\u003cbr\u003e \u003cbr\u003e Appendix O: np Values for Various Confidence Intervals, Probabilities of Acceptance, and Numbers of Nonconforming Units.\u003cbr\u003e \u003cbr\u003e Glossary.\u003cbr\u003e \u003cbr\u003e Index.","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49402527416663,"sku":"9780471209577","price":159.26,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9780471209577.jpg?v=1730480672","url":"https:\/\/bookcurl.com\/products\/process-improvement-in-the-electronics-industry-24-wiley-series-in-systems-engineering-and-management-9780471209577","provider":"Book Curl","version":"1.0","type":"link"}