{"product_id":"principles-of-testing-electronic-systems-9780471319313","title":"Principles of Testing Electronic Systems","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eA pragmatic approach to testing electronic systems  As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTrade Review\u003c\/b\u003e\u003cbr\u003e\"Highly recommended for libraries serving undergraduate and graduate electrical engineering students and professional practitioners.\" (Choice, Vol. 38, No. 7, March 2001)\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003eDESIGN AND TEST.\u003cbr\u003e \u003cbr\u003e Overview of Testing.\u003cbr\u003e \u003cbr\u003e Defects, Failures, and Faults.\u003cbr\u003e \u003cbr\u003e Design Representation.\u003cbr\u003e \u003cbr\u003e VLSI Design Flow.\u003cbr\u003e \u003cbr\u003e TEST FLOW.\u003cbr\u003e \u003cbr\u003e Role of Simulation in Testing.\u003cbr\u003e \u003cbr\u003e Automatic Test Pattern Generation.\u003cbr\u003e \u003cbr\u003e Current Testing.\u003cbr\u003e \u003cbr\u003e DESIGN FOR TESTABILITY.\u003cbr\u003e \u003cbr\u003e Ad Hoc Test Techniques.\u003cbr\u003e \u003cbr\u003e Scan-Path Design.\u003cbr\u003e \u003cbr\u003e Boundary-Scan Testing.\u003cbr\u003e \u003cbr\u003e Built-in Self-Test.\u003cbr\u003e \u003cbr\u003e SPECIAL STRUCTURES.\u003cbr\u003e \u003cbr\u003e Memory Testing.\u003cbr\u003e \u003cbr\u003e Testing FPGAs and Microprocessors.\u003cbr\u003e \u003cbr\u003e ADVANCED TOPICS.\u003cbr\u003e \u003cbr\u003e Synthesis for Testability.\u003cbr\u003e \u003cbr\u003e Testing SOCs.\u003cbr\u003e \u003cbr\u003e Appendices.\u003cbr\u003e \u003cbr\u003e Index.","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49402563461463,"sku":"9780471319313","price":128.66,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9780471319313.jpg?v=1730480768","url":"https:\/\/bookcurl.com\/products\/principles-of-testing-electronic-systems-9780471319313","provider":"Book Curl","version":"1.0","type":"link"}