{"product_id":"microstructural-characterization-of-materials-2nd-edition-9780470027851","title":"Microstructural Characterization of Materials 2nd","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eMicrostructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003ePreface to the Second Edition.  \u003cp\u003ePreface to the First Edition.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1. The Concept of Microstructure.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1. Microstructural Features.\u003c\/p\u003e \u003cp\u003e1.2. Crystallography and Crystal Structure.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2. Diffraction Analysis of Crystal Structure.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1. Scattering of Radiation by Crystals.\u003c\/p\u003e \u003cp\u003e2.2. Reciprocal Space.\u003c\/p\u003e \u003cp\u003e2.3. X-ray Diffraction Methods.\u003c\/p\u003e \u003cp\u003e2.4. Diffraction Analysis.\u003c\/p\u003e \u003cp\u003e2.5. Electron Diffraction.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3. Optical Microscopy.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1. Geometrical Optics.\u003c\/p\u003e \u003cp\u003e3.2. Construction of the Microscope.\u003c\/p\u003e \u003cp\u003e3.3. Specimen Preparation.\u003c\/p\u003e \u003cp\u003e3.4. Image contrast.\u003c\/p\u003e \u003cp\u003e3.5. Working with Digital Images.\u003c\/p\u003e \u003cp\u003e3.6. Resolution, contrast and Image Interpretation.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4. Transmission Electron Microscopy.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1. Basic Principles.\u003c\/p\u003e \u003cp\u003e4.2. Specimen Preparation.\u003c\/p\u003e \u003cp\u003e4.3. The Origin of Contrast.\u003c\/p\u003e \u003cp\u003e4.4. Kinematic Interpretation of Diffraction Contrast.\u003c\/p\u003e \u003cp\u003e4.5. Dynamic Diffraction and Absorption effects.\u003c\/p\u003e \u003cp\u003e4.6. Lattice Imaging at High Resolution.\u003c\/p\u003e \u003cp\u003e4.7. Scanning Transmission Electron Microscopy.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5. Scanning Electron Microscopy.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1. Components of The Scanning electron Microscope.\u003c\/p\u003e \u003cp\u003e5.2. Electron Beam-Specimen Interactions.\u003c\/p\u003e \u003cp\u003e5.3. Electron Excitation of X-Rays.\u003c\/p\u003e \u003cp\u003e5.4. Backscattered Electrons.\u003c\/p\u003e \u003cp\u003e5.5. Secondary Electron Emission.\u003c\/p\u003e \u003cp\u003e5.6. Alternative Imaging Modes.\u003c\/p\u003e \u003cp\u003e5.7. Specimen Preparation and Topology.\u003c\/p\u003e \u003cp\u003e5.8. Focused Ion Beam Microscopy.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6. Microanalysis in Electron Microscopy.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1. X-Ray Microanalysis.\u003c\/p\u003e \u003cp\u003e6.2. Electron Energy Loss Spectroscopy.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7. Scanning Probe Microscopy and Related Techniques.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1. Surface Forces and Surface Morphology.\u003c\/p\u003e \u003cp\u003e7.2. Scanning Probe Microscopes.\u003c\/p\u003e \u003cp\u003e7.3. Field-Ion Microscopy and Atom Probe tomography.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8. Chemical Analysis of Surface Composition.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1. X-ray Photoelectron Spectroscopy.\u003c\/p\u003e \u003cp\u003e8.2. Auger Electron Spectroscopy.\u003c\/p\u003e \u003cp\u003e8.3. Secondary-Ion Mass Spectrometry.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9. Quantitative and Tomographic Analysis of Microstructure.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1. Basic Stereological Concepts.\u003c\/p\u003e \u003cp\u003e9.2. Accessible and Inaccessible Parameters.\u003c\/p\u003e \u003cp\u003e9.3. Optimizing Accuracy.\u003c\/p\u003e \u003cp\u003e9.4. Automated Image Analysis.\u003c\/p\u003e \u003cp\u003e9.5. Tomography and Three-Dimensional Reconstruction.\u003c\/p\u003e \u003cp\u003eAppendices.\u003c\/p\u003e \u003cp\u003eIndex.\u003c\/p\u003e","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49402263961943,"sku":"9780470027851","price":49.35,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9780470027851.jpg?v=1730479879","url":"https:\/\/bookcurl.com\/products\/microstructural-characterization-of-materials-2nd-edition-9780470027851","provider":"Book Curl","version":"1.0","type":"link"}