{"product_id":"internal-reflection-and-atr-spectroscopy-9780470278321","title":"Internal Reflection and ATR Spectroscopy","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eAttenuated Total Reflection (ATR) spectroscopy is the most frequently used sampling technique for infrared spectroscopy, enabling samples to be examined in solid or liquid states. This book shows how ATR is used for materials that are either too thick or strong to be analyzed by other methods.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003e\u003cp\u003ePreface xiii\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1 Introduction to Spectroscopy 1\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1 History 1\u003c\/p\u003e \u003cp\u003e1.2 Definition of Transmittance and Reflectance 6\u003c\/p\u003e \u003cp\u003e1.3 The Spectroscopic Experiment and the Spectrometer 10\u003c\/p\u003e \u003cp\u003e1.4 Propagation of Light through a Medium 13\u003c\/p\u003e \u003cp\u003e1.5 Transmittance and Absorbance 15\u003c\/p\u003e \u003cp\u003e1.6 S\/N in a Spectroscopic Measurement 16\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2 Harmonic Oscillator Model for Optical Constants 20\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Harmonic Oscillator Model for Polarizability 20\u003c\/p\u003e \u003cp\u003e2.2 Clausius–Mossotti Equation 25\u003c\/p\u003e \u003cp\u003e2.3 Refractive Index 26\u003c\/p\u003e \u003cp\u003e2.4 Absorption Index and Concentration 29\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3 Propagation of Electromagnetic Energy 31\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1 Poynting Vector and Flow of Electromagnetic Energy 31\u003c\/p\u003e \u003cp\u003e3.2 Linear Momentum of Light 34\u003c\/p\u003e \u003cp\u003e3.3 Light Absorption in Absorbing Media 35\u003c\/p\u003e \u003cp\u003e3.4 Lambert Law and Molecular Cross Section 36\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4 Fresnel Equations 39\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 Electromagnetic Fields at the Interface 39\u003c\/p\u003e \u003cp\u003e4.2 Snell’s Law 41\u003c\/p\u003e \u003cp\u003e4.3 Boundary Conditions at the Interface 42\u003c\/p\u003e \u003cp\u003e4.4 Fresnel Formulae 43\u003c\/p\u003e \u003cp\u003e4.5 Refl ectance and Transmitance of Interface 44\u003c\/p\u003e \u003cp\u003e4.6 Snell’s Pairs 46\u003c\/p\u003e \u003cp\u003e4.7 Normal Incidence 47\u003c\/p\u003e \u003cp\u003e4.8 Brewster’s Angle 47\u003c\/p\u003e \u003cp\u003e4.9 The Case of the 45° Angle of Incidence 48\u003c\/p\u003e \u003cp\u003e4.10 Total Internal Reflection 49\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5 Evanescent Wave 55\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 Exponential Decay and Penetration Depth 55\u003c\/p\u003e \u003cp\u003e5.2 Energy Flow at a Totally Internally Reflecting Interface 58\u003c\/p\u003e \u003cp\u003e5.3 The Evanescent Wave in Absorbing Materials 59\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6 Electric Fields at a Totally Internally Reflecting Interface 61\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1 Ex, Ey, and Ez for s-Polarized Incident Light 61\u003c\/p\u003e \u003cp\u003e6.2 Ex, Ey, and Ez for p-Polarized Incident Light 62\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7 Anatomy of ATR Absorption 67\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1 Attenuated Total Reflection (ATR) Reflectance for s- and p-Polarized Beam 67\u003c\/p\u003e \u003cp\u003e7.2 Absorbance Transform of ATR Spectra 69\u003c\/p\u003e \u003cp\u003e7.3 Weak Absorption Approximation 70\u003c\/p\u003e \u003cp\u003e7.4 Supercritical Reflectance and Absorption of Evanescent Wave 73\u003c\/p\u003e \u003cp\u003e7.5 The Leaky Interface Model 76\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8 Effective Thickness 79\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1 Defi nition and Expressions for Effective Thickness 79\u003c\/p\u003e \u003cp\u003e8.2 Effective Thickness and Penetration Depth 80\u003c\/p\u003e \u003cp\u003e8.3 Effective Thickness and ATR Spectroscopy 82\u003c\/p\u003e \u003cp\u003e8.4 Effective Thickness for Strong Absorptions 84\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9 Internal Reflectance near Critical Angle 85\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1 Transition from Subcritical to Supercritical Reflection 85\u003c\/p\u003e \u003cp\u003e9.2 Effective Thickness and Refractive Index of Sample 87\u003c\/p\u003e \u003cp\u003e9.3 Critical Angle and Refractive Index of Sample 88\u003c\/p\u003e \u003cp\u003e\u003cb\u003e10 Depth Profiling 92\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e10.1 Energy Absorption at Different Depths 92\u003c\/p\u003e \u003cp\u003e10.2 Thin Absorbing Layer on a Nonabsorbing Substrate 93\u003c\/p\u003e \u003cp\u003e10.3 Thin Nonabsorbing Film on an Absorbing Substrate 94\u003c\/p\u003e \u003cp\u003e10.4 Thin Nonabsorbing Film on a Thin Absorbing Film on a Nonabsorbing Substrate 94\u003c\/p\u003e \u003cp\u003e\u003cb\u003e11 Multiple Interfaces 97\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e11.1 Reflectance and Transmittance of a Two-Interface System 97\u003c\/p\u003e \u003cp\u003e11.2 Very Thin Films 100\u003c\/p\u003e \u003cp\u003e11.3 Interference Fringes 101\u003c\/p\u003e \u003cp\u003e11.4 Normal Incidence 102\u003c\/p\u003e \u003cp\u003e11.5 Interference Fringes and Transmission Spectroscopy 104\u003c\/p\u003e \u003cp\u003e11.6 Thin Films and ATR 108\u003c\/p\u003e \u003cp\u003e11.7 Internal Reflection: Subcritical, Supercritical, and in between 109\u003c\/p\u003e \u003cp\u003e11.8 Unusual Fringes 110\u003c\/p\u003e \u003cp\u003e11.9 Penetration Depth Revisited 113\u003c\/p\u003e \u003cp\u003e11.10 Reflectance and Transmittance of a Multiple Interface System 116\u003c\/p\u003e \u003cp\u003e\u003cb\u003e12 Metal Optics 121\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e12.1 Electromagnetic Fields in Metals 121\u003c\/p\u003e \u003cp\u003e12.2 Plasma 126\u003c\/p\u003e \u003cp\u003e12.3 Reflectance of Metal Surfaces 127\u003c\/p\u003e \u003cp\u003e12.4 Thin Metal Films on Transparent Substrates 130\u003c\/p\u003e \u003cp\u003e12.5 Curious Reflectance of Extremely Thin Metal Films 132\u003c\/p\u003e \u003cp\u003e12.6 ATR Spectroscopy through Thin Metal Films 134\u003c\/p\u003e \u003cp\u003e\u003cb\u003e13 Grazing Angle ATR (GAATR) Spectroscopy 136\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e13.1 Attenuated Total Refl ection (ATR) Spectroscopy of Thin Films on Silicon Substrates 136\u003c\/p\u003e \u003cp\u003e13.2 Enhancement for s- and p-Polarized Light 137\u003c\/p\u003e \u003cp\u003e13.3 Enhancement and Film Thickness 139\u003c\/p\u003e \u003cp\u003e13.4 Electric Fields in a Very Thin Film on a Si Substrate 141\u003c\/p\u003e \u003cp\u003e13.5 Source of Enhancement 143\u003c\/p\u003e \u003cp\u003e13.6 GAATR Spectroscopy 145\u003c\/p\u003e \u003cp\u003e\u003cb\u003e14 Super Grazing Angle Reflection Spectroscopy (SuGARS) 147\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e14.1 Reflectance of Thin Films on Metal Substrates 147\u003c\/p\u003e \u003cp\u003e14.2 Problem of Reference 148\u003c\/p\u003e \u003cp\u003e14.3 Sensitivity Enhancement 150\u003c\/p\u003e \u003cp\u003e\u003cb\u003e15 ATR Experiment 151\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e15.1 Multiple Reflection Attenuated Total Reflection (ATR) 151\u003c\/p\u003e \u003cp\u003e15.2 Facet Reflections 155\u003c\/p\u003e \u003cp\u003e15.3 Beam Spread and the Angle of Incidence 156\u003c\/p\u003e \u003cp\u003e15.4 Effect of Facet Shape 158\u003c\/p\u003e \u003cp\u003e15.5 Beam Spread and the Number of Reflections in Multiple Refl ection ATR 160\u003c\/p\u003e \u003cp\u003e15.6 Effect of Beam Alignment on Multiple Reflection ATR 162\u003c\/p\u003e \u003cp\u003e15.7 Change in the Refractive Index of the Sample due to Concentration Change 166\u003c\/p\u003e \u003cp\u003e\u003cb\u003e16 ATR Spectroscopy of Small Samples 168\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e16.1 Benefits of Attenuated Total Reflection (ATR) for Microsampling 168\u003c\/p\u003e \u003cp\u003e16.2 Contact Problem for Solid Samples 170\u003c\/p\u003e \u003cp\u003e\u003cb\u003e17 Surface Plasma Waves 172\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e17.1 Excitation of Surface Plasma Waves 172\u003c\/p\u003e \u003cp\u003e17.2 Effect of Metal Film Thickness on Reflectance 173\u003c\/p\u003e \u003cp\u003e17.3 Effect of the Refractive Index of Metal on Reflectance 174\u003c\/p\u003e \u003cp\u003e17.4 Effect of the Absorption Index of Metal on Reflectance 174\u003c\/p\u003e \u003cp\u003e17.5 Use of Plasmons for Detecting Minute Changes of the Refractive Index of Materials 175\u003c\/p\u003e \u003cp\u003e17.6 Use of Plasmons for Detecting Minute Changes of the Absorption Index of Materials 178\u003c\/p\u003e \u003cp\u003e\u003cb\u003e18 Extraction of Optical Constants of Materials from Experiments 180\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e18.1 Extraction of Optical Constants from Multiple Experiments 180\u003c\/p\u003e \u003cp\u003e18.2 Kramers–Kronig Relations 184\u003c\/p\u003e \u003cp\u003e18.3 Kramers–Kronig Equations for Normal Incidence Reflectance 187\u003c\/p\u003e \u003cp\u003e\u003cb\u003e19 ATR Spectroscopy of Powders 192\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e19.1 Propagation of Light through Inhomogeneous Media 192\u003c\/p\u003e \u003cp\u003e19.2 Spectroscopic Analysis of Powdered Samples 193\u003c\/p\u003e \u003cp\u003e19.3 Particle Size and Absorbance of Powders 195\u003c\/p\u003e \u003cp\u003e19.4 Propagation of Evanescent Wave in Powdered Media 198\u003c\/p\u003e \u003cp\u003e\u003cb\u003e20 Energy Flow at a Totally Internally Reflecting Interface 209\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e20.1 Energy Conservation at a Totally Reflecting Interface 209\u003c\/p\u003e \u003cp\u003e20.2 Speed of Propagation and the Formation of an Evanescent Wave 212\u003c\/p\u003e \u003cp\u003e\u003cb\u003e21 Orientation Studies and ATR Spectroscopy 214\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e21.1 Oriented Fraction and Dichroic Ratio 214\u003c\/p\u003e \u003cp\u003e21.2 Orientation and Field Strengths in Attenuated Total Reflection (ATR) 217\u003c\/p\u003e \u003cp\u003e\u003cb\u003e22 Applications of ATR Spectroscopy 220\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e22.1 Solid Samples 220\u003c\/p\u003e \u003cp\u003e22.2 Liquid Samples 220\u003c\/p\u003e \u003cp\u003e22.3 Powders 221\u003c\/p\u003e \u003cp\u003e22.4 Surface-Modified Solid Samples 221\u003c\/p\u003e \u003cp\u003e22.5 High Sample Throughput ATR Analysis 221\u003c\/p\u003e \u003cp\u003e22.6 Process and Reaction Monitoring 222\u003c\/p\u003e \u003cp\u003eAppendix A ATR Correction 224\u003c\/p\u003e \u003cp\u003eAppendix B Quantification in ATR Spectroscopy 227\u003c\/p\u003e \u003cp\u003eIndex 237\u003c\/p\u003e","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49525369667927,"sku":"9780470278321","price":999.99,"currency_code":"GBP","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9780470278321.jpg?v=1731860260","url":"https:\/\/bookcurl.com\/products\/internal-reflection-and-atr-spectroscopy-9780470278321","provider":"Book Curl","version":"1.0","type":"link"}