{"product_id":"integrated-circuit-manufacturability-9780780334472","title":"Integrated Circuit Manufacturability","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eINTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage.\u003cbr\u003e \u003cbr\u003e INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today''s design practice\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003ePreface.\u003cbr\u003e \u003cbr\u003e Introduction (Jose Pineda de Gyvez).\u003cbr\u003e \u003cbr\u003e Defect Monitoring and Characterization (Eric Bruls).\u003cbr\u003e \u003cbr\u003e Digital CMOS Fault Modeling and Inductive Fault Analysis (Manoj Sachdev).\u003cbr\u003e \u003cbr\u003e Functional Yield Modeling (Gary C. Cheek and Geoff O'Donoghue).\u003cbr\u003e \u003cbr\u003e Critical Area and Fault Probability Prediction (D.M.H. Walker).\u003cbr\u003e \u003cbr\u003e Statistical Methods of Parametric Yield and Quality Enhancement (Maciej Styblinski).\u003cbr\u003e \u003cbr\u003e Architectural Fault Tolerance (S.K. Tewksbury).\u003cbr\u003e \u003cbr\u003e Design for Test and Manufacturability (Dhiraj Pradhan and Adit Singh).\u003cbr\u003e \u003cbr\u003e Testing Solutions for MCM Manufacturing (Yervant Zorian).\u003cbr\u003e \u003cbr\u003e Index.\u003cbr\u003e \u003cbr\u003e About the Editors.","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49404990128471,"sku":"9780780334472","price":187.16,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9780780334472.jpg?v=1730488297","url":"https:\/\/bookcurl.com\/products\/integrated-circuit-manufacturability-9780780334472","provider":"Book Curl","version":"1.0","type":"link"}