{"product_id":"digital-systems-testing-revised-9780780310629","title":"Digital Systems Testing Revised","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eThis updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003ePreface.\u003cbr\u003e \u003cbr\u003e How This Book Was Written.\u003cbr\u003e \u003cbr\u003e Introduction.\u003cbr\u003e \u003cbr\u003e Modeling.\u003cbr\u003e \u003cbr\u003e Logic Simulation.\u003cbr\u003e \u003cbr\u003e Fault Modeling.\u003cbr\u003e \u003cbr\u003e Fault Simulation.\u003cbr\u003e \u003cbr\u003e Testing For Single Stuck Faults.\u003cbr\u003e \u003cbr\u003e Testing For Bridging Faults.\u003cbr\u003e \u003cbr\u003e Functional Testing.\u003cbr\u003e \u003cbr\u003e Design For Testability.\u003cbr\u003e \u003cbr\u003e Compression Techniques.\u003cbr\u003e \u003cbr\u003e Built-In Self-Test.\u003cbr\u003e \u003cbr\u003e Logic-Level Diagnosis.\u003cbr\u003e \u003cbr\u003e Self-Checking Design.\u003cbr\u003e \u003cbr\u003e PLA Testing.\u003cbr\u003e \u003cbr\u003e System-Level Diagnosis.\u003cbr\u003e \u003cbr\u003e Index.","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49404987441495,"sku":"9780780310629","price":151.16,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9780780310629.jpg?v=1730488293","url":"https:\/\/bookcurl.com\/products\/digital-systems-testing-revised-9780780310629","provider":"Book Curl","version":"1.0","type":"link"}