{"product_id":"cmos-electronics-how-it-works-how-it-fails-9780471476696","title":"CMOS Electronics How It Works How It Fails","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003eCMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book will teach readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTrade Review\u003c\/b\u003e\u003cbr\u003e\"...an essential text for practitioners in the CMOS industry or for students headed there…\" (\u003ci\u003eIEEE Solid-State Circuits Society Newsletter\u003c\/i\u003e, October 2004)\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003eForeword.  \u003cp\u003ePreface.\u003c\/p\u003e \u003cp\u003e\u003cb\u003ePART I: CMOS FUNDAMENTALS.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1\u003c\/b\u003e \u003cb\u003eElectrical Circuit Analysis.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1 Introduction.\u003c\/p\u003e \u003cp\u003e1.2 Voltage and Current Laws.\u003c\/p\u003e \u003cp\u003e1.3 Capacitors.\u003c\/p\u003e \u003cp\u003e1.4 Diodes.\u003c\/p\u003e \u003cp\u003e1.5 Summary.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2 Semiconductor Physics.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Semiconductor Fundamentals.\u003c\/p\u003e \u003cp\u003e2.2 Intrinsic and Extrinsic Semiconductors.\u003c\/p\u003e \u003cp\u003e2.3 Carrier Transport in Semiconductors.\u003c\/p\u003e \u003cp\u003e2.4 The \u003ci\u003epn\u003c\/i\u003e Junction.\u003c\/p\u003e \u003cp\u003e2.5 Biasing the \u003ci\u003epn\u003c\/i\u003e Junction: I–V Characteristics.\u003c\/p\u003e \u003cp\u003e2.6 Parasitics in the Diode.\u003c\/p\u003e \u003cp\u003e2.7 Summary.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3 MOSFET Transistors.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1 Principles of Operation: Long-Channel Transistors.\u003c\/p\u003e \u003cp\u003e3.2 Threshold Voltage in MOS Transistors.\u003c\/p\u003e \u003cp\u003e3.3 Parasitic Capacitors in MOS Transistors.\u003c\/p\u003e \u003cp\u003e3.4 Device Scaling: Short-Channel MOS Transistors.\u003c\/p\u003e \u003cp\u003e3.5 Summary.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4 CMOS Basic Gates.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 Introduction.\u003c\/p\u003e \u003cp\u003e4.2 The CMOS Inverter.\u003c\/p\u003e \u003cp\u003e4.3 NAND Gates.\u003c\/p\u003e \u003cp\u003e4.4 NOR Gates.\u003c\/p\u003e \u003cp\u003e4.5 CMOS Transmission Gates.\u003c\/p\u003e \u003cp\u003e4.6 Summary.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5 CMOS Basic Circuits.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 Combinational logic.\u003c\/p\u003e \u003cp\u003e5.2 Sequential Logic.\u003c\/p\u003e \u003cp\u003e5.3 Input–Output (I\/O) Circuitry.\u003c\/p\u003e \u003cp\u003e5.4 Summary.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003ePART II FAILURE MODES, DEFECTS, AND TESTING OF CMOS Ics.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6 Failure Mechanisms in CMOS IC Materials.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1 Introduction.\u003c\/p\u003e \u003cp\u003e6.2 Materials Science of IC Metals.\u003c\/p\u003e \u003cp\u003e6.3 Metal Failure Modes.\u003c\/p\u003e \u003cp\u003e6.4 Oxide Failure Modes.\u003c\/p\u003e \u003cp\u003e6.5 Conclusion.\u003c\/p\u003e \u003cp\u003eAcknowledgments.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7 Bridging Defects.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1 Introduction.\u003c\/p\u003e \u003cp\u003e7.2 Bridges in ICs: Critical Resistance and Modeling.\u003c\/p\u003e \u003cp\u003e7.3 Gate Oxide Shorts (GOS).\u003c\/p\u003e \u003cp\u003e7.4 Bridges in Combinational Circuits.\u003c\/p\u003e \u003cp\u003e7.5 Bridges in Sequential Circuits.\u003c\/p\u003e \u003cp\u003e7.6 Bridging Faults and Technology Scaling.\u003c\/p\u003e \u003cp\u003e7.7 Conclusion.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8 Open Defects.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1 Introduction.\u003c\/p\u003e \u003cp\u003e8.2 Modeling Floating Nodes in ICs.\u003c\/p\u003e \u003cp\u003e8.3 Open Defect Classes.\u003c\/p\u003e \u003cp\u003e8.4 Summary.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9 Parametric Failures.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1 Introduction.\u003c\/p\u003e \u003cp\u003e9.2 Intrinsic Parametric Failures.\u003c\/p\u003e \u003cp\u003e9.3 Intrinsic Parametric Failure Impact on IC Behavior.\u003c\/p\u003e \u003cp\u003e9.4 Extrinsic Parametric Failure.\u003c\/p\u003e \u003cp\u003e9.5 Conclusion.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1\u003c\/b\u003e\u003cb\u003e0 Defect-Based Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e10.1 Introduction.\u003c\/p\u003e \u003cp\u003e10.2 Digital IC Testing: The Basics.\u003c\/p\u003e \u003cp\u003e10.3 Design for Test.\u003c\/p\u003e \u003cp\u003e10.4 Defect-Based Testing (DBT).\u003c\/p\u003e \u003cp\u003e10.5 Testing Nanometer ICs.\u003c\/p\u003e \u003cp\u003e10.6 Conclusions.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eAppendix A:\u003c\/b\u003e \u003cb\u003eSolutions to Self-Exercises.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eA.1 Chapter 1.\u003c\/p\u003e \u003cp\u003eA.2 Chapter 3.\u003c\/p\u003e \u003cp\u003eA.3 Chapter 4.\u003c\/p\u003e \u003cp\u003eA.4 Chapter 5.\u003c\/p\u003e \u003cp\u003eA.5 Chapter 6.\u003c\/p\u003e \u003cp\u003eA.6 Chapter 7.\u003c\/p\u003e \u003cp\u003eA.8 Chapter 8.\u003c\/p\u003e \u003cp\u003eA.8 Chapter 10.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eIndex.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003eAbout the Authors.\u003c\/b\u003e\u003c\/p\u003e","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49402605928791,"sku":"9780471476696","price":125.96,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0817\/1739\/5799\/files\/9780471476696.jpg?v=1730480938","url":"https:\/\/bookcurl.com\/products\/cmos-electronics-how-it-works-how-it-fails-9780471476696","provider":"Book Curl","version":"1.0","type":"link"}