{"product_id":"accelerated-life-testing-of-oneshot-devices-9781119664000","title":"Accelerated Life Testing of Oneshot Devices","description":"\u003cb\u003eBook Synopsis\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cb\u003eProvides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eEstimating the reliability of one-shot deviceselectro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only onceposes unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests.\u003c\/p\u003e \u003cp\u003e\u003ci\u003eAccelerated Life Testing of One-shot Devices: Data Collection and Analysis\u003c\/i\u003e addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability pr\u003cbr\u003e\u003cbr\u003e\u003cb\u003eTable of Contents\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003ePreface xi\u003c\/p\u003e \u003cp\u003eAbout the Companion Website xiii\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1 One-Shot Device Testing Data \u003c\/b\u003e\u003cb\u003e1\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1 Brief Overview 1\u003c\/p\u003e \u003cp\u003e1.2 One-Shot Devices 1\u003c\/p\u003e \u003cp\u003e1.3 Accelerated Life-Tests 3\u003c\/p\u003e \u003cp\u003e1.4 Examples in Reliability and Survival Studies 4\u003c\/p\u003e \u003cp\u003e1.4.1 Electro-Explosive Devices Data 4\u003c\/p\u003e \u003cp\u003e1.4.2 Glass Capacitors Data 5\u003c\/p\u003e \u003cp\u003e1.4.3 Solder Joints Data 5\u003c\/p\u003e \u003cp\u003e1.4.4 Grease-Based Magnetorheological Fluids Data 6\u003c\/p\u003e \u003cp\u003e1.4.5 Mice Tumor Toxicological Data 7\u003c\/p\u003e \u003cp\u003e1.4.6 ED01 Experiment Data 7\u003c\/p\u003e \u003cp\u003e1.4.7 Serial Sacrifice Data 7\u003c\/p\u003e \u003cp\u003e1.5 Recent Developments in One-Shot Device Testing Analysis 10\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2 Likelihood Inference \u003c\/b\u003e\u003cb\u003e13\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Brief Overview 13\u003c\/p\u003e \u003cp\u003e2.2 Under CSALTs and Different Lifetime Distributions 13\u003c\/p\u003e \u003cp\u003e2.3 EM-Algorithm 14\u003c\/p\u003e \u003cp\u003e2.3.1 Exponential Distribution 16\u003c\/p\u003e \u003cp\u003e2.3.2 Gamma Distribution 18\u003c\/p\u003e \u003cp\u003e2.3.3 Weibull Distribution 21\u003c\/p\u003e \u003cp\u003e2.4 Interval Estimation 26\u003c\/p\u003e \u003cp\u003e2.4.1 Asymptotic Confidence Intervals 26\u003c\/p\u003e \u003cp\u003e2.4.2 Approximate Confidence Intervals 28\u003c\/p\u003e \u003cp\u003e2.5 Simulation Studies 30\u003c\/p\u003e \u003cp\u003e2.6 Case Studies with R Codes 41\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3 Bayesian Inference \u003c\/b\u003e\u003cb\u003e47\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1 Brief Overview 47\u003c\/p\u003e \u003cp\u003e3.2 Bayesian Framework 47\u003c\/p\u003e \u003cp\u003e3.3 Choice of Priors 49\u003c\/p\u003e \u003cp\u003e3.3.1 Laplace Prior 49\u003c\/p\u003e \u003cp\u003e3.3.2 Normal Prior 49\u003c\/p\u003e \u003cp\u003e3.3.3 Beta Prior 50\u003c\/p\u003e \u003cp\u003e3.4 Simulation Studies 51\u003c\/p\u003e \u003cp\u003e3.5 Case Study with R Codes 59\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4 Model Mis-Specification Analysis and Model Selection \u003c\/b\u003e\u003cb\u003e65\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 Brief Overview 65\u003c\/p\u003e \u003cp\u003e4.2 Model Mis-Specification Analysis 65\u003c\/p\u003e \u003cp\u003e4.3 Model Selection 66\u003c\/p\u003e \u003cp\u003e4.3.1 Akaike Information Criterion 66\u003c\/p\u003e \u003cp\u003e4.3.2 Bayesian Information Criterion 67\u003c\/p\u003e \u003cp\u003e4.3.3 Distance-Based Test Statistic 68\u003c\/p\u003e \u003cp\u003e4.3.4 Parametric Bootstrap Procedure for Testing Goodness-of-Fit 70\u003c\/p\u003e \u003cp\u003e4.4 Simulation Studies 70\u003c\/p\u003e \u003cp\u003e4.5 Case Study with R Codes 76\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5 Robust Inference \u003c\/b\u003e\u003cb\u003e79\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 Brief Overview 79\u003c\/p\u003e \u003cp\u003e5.2 Weighted Minimum Density Power Divergence Estimators 79\u003c\/p\u003e \u003cp\u003e5.3 Asymptotic Distributions 81\u003c\/p\u003e \u003cp\u003e5.4 RobustWald-type Tests 82\u003c\/p\u003e \u003cp\u003e5.5 Influence Function 83\u003c\/p\u003e \u003cp\u003e5.6 Simulation Studies 85\u003c\/p\u003e \u003cp\u003e5.7 Case Study with R Codes 91\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6 Semi-Parametric Models and Inference \u003c\/b\u003e\u003cb\u003e95\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1 Brief Overview 95\u003c\/p\u003e \u003cp\u003e6.2 Proportional Hazards Models 95\u003c\/p\u003e \u003cp\u003e6.3 Likelihood Inference 97\u003c\/p\u003e \u003cp\u003e6.4 Test of Proportional Hazard Rates 99\u003c\/p\u003e \u003cp\u003e6.5 Simulation Studies 100\u003c\/p\u003e \u003cp\u003e6.6 Case Studies with R Codes 102\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7 Optimal Design of Tests \u003c\/b\u003e\u003cb\u003e105\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1 Brief Overview 105\u003c\/p\u003e \u003cp\u003e7.2 Optimal Design of CSALTs 105\u003c\/p\u003e \u003cp\u003e7.3 Optimal Design with Budget Constraints 106\u003c\/p\u003e \u003cp\u003e7.3.1 Subject to Specified Budget and Termination Time 107\u003c\/p\u003e \u003cp\u003e7.3.2 Subject to Standard Deviation and Termination Time 107\u003c\/p\u003e \u003cp\u003e7.4 Case Studies with R Codes 108\u003c\/p\u003e \u003cp\u003e7.5 Sensitivity of Optimal Designs 113\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8 Design of Simple Step-Stress Accelerated Life-Tests \u003c\/b\u003e\u003cb\u003e119\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1 Brief Overview 119\u003c\/p\u003e \u003cp\u003e8.2 One-Shot Device Testing Data Under Simple SSALTs 119\u003c\/p\u003e \u003cp\u003e8.3 Asymptotic Variance 121\u003c\/p\u003e \u003cp\u003e8.3.1 Exponential Distribution 121\u003c\/p\u003e \u003cp\u003e8.3.2 Weibull Distribution 122\u003c\/p\u003e \u003cp\u003e8.3.3 With a Known Shape Parameter \u003ci\u003e𝑤\u003c\/i\u003e\u003csub\u003e2\u003c\/sub\u003e 124\u003c\/p\u003e \u003cp\u003e8.3.4 With a Known Parameter About Stress Level \u003ci\u003e𝑤\u003c\/i\u003e\u003csub\u003e1\u003c\/sub\u003e 125\u003c\/p\u003e \u003cp\u003e8.4 Optimal Design of Simple SSALT 126\u003c\/p\u003e \u003cp\u003e8.5 Case Studies with R Codes 128\u003c\/p\u003e \u003cp\u003e8.5.1 SSALT for Exponential Distribution 128\u003c\/p\u003e \u003cp\u003e8.5.2 SSALT forWeibull Distribution 131\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9 Competing-Risks Models \u003c\/b\u003e\u003cb\u003e141\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1 Brief Overview 141\u003c\/p\u003e \u003cp\u003e9.2 One-Shot Device Testing Data with Competing Risks 141\u003c\/p\u003e \u003cp\u003e9.3 Likelihood Estimation for Exponential Distribution 143\u003c\/p\u003e \u003cp\u003e9.3.1 Without Masked Failure Modes 144\u003c\/p\u003e \u003cp\u003e9.3.2 With Masked Failure Modes 147\u003c\/p\u003e \u003cp\u003e9.4 Likelihood Estimation forWeibull Distribution 149\u003c\/p\u003e \u003cp\u003e9.5 Bayesian Estimation 155\u003c\/p\u003e \u003cp\u003e9.5.1 Without Masked Failure Modes 155\u003c\/p\u003e \u003cp\u003e9.5.2 Laplace Prior 156\u003c\/p\u003e \u003cp\u003e9.5.3 Normal Prior 157\u003c\/p\u003e \u003cp\u003e9.5.4 Dirichlet Prior 157\u003c\/p\u003e \u003cp\u003e9.5.5 With Masked Failure Modes 158\u003c\/p\u003e \u003cp\u003e9.6 Simulation Studies 159\u003c\/p\u003e \u003cp\u003e9.7 Case Study with R Codes 165\u003c\/p\u003e \u003cp\u003e\u003cb\u003e10 One-Shot Devices with Dependent Components \u003c\/b\u003e\u003cb\u003e173\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e10.1 Brief Overview 173\u003c\/p\u003e \u003cp\u003e10.2 Test Data with Dependent Components 173\u003c\/p\u003e \u003cp\u003e10.3 Copula Models 174\u003c\/p\u003e \u003cp\u003e10.3.1 Family of Archimedean Copulas 175\u003c\/p\u003e \u003cp\u003e10.3.2 Gumbel–Hougaard Copula 176\u003c\/p\u003e \u003cp\u003e10.3.3 Frank Copula 177\u003c\/p\u003e \u003cp\u003e10.4 Estimation of Dependence 180\u003c\/p\u003e \u003cp\u003e10.5 Simulation Studies 181\u003c\/p\u003e \u003cp\u003e10.6 Case Study with R Codes 184\u003c\/p\u003e \u003cp\u003e\u003cb\u003e11 Conclusions and Future Directions \u003c\/b\u003e\u003cb\u003e187\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e11.1 Brief Overview 187\u003c\/p\u003e \u003cp\u003e11.2 Concluding Remarks 187\u003c\/p\u003e \u003cp\u003e11.2.1 Large Sample Sizes for Flexible Models 187\u003c\/p\u003e \u003cp\u003e11.2.2 Accurate Estimation 188\u003c\/p\u003e \u003cp\u003e11.2.3 Good Designs Before Data Analysis 188\u003c\/p\u003e \u003cp\u003e11.3 Future Directions 189\u003c\/p\u003e \u003cp\u003e11.3.1 Weibull Lifetime Distribution with Threshold Parameter 189\u003c\/p\u003e \u003cp\u003e11.3.2 Frailty Models 189\u003c\/p\u003e \u003cp\u003e11.3.3 Optimal Design of SSALTs with Multiple Stress Levels 189\u003c\/p\u003e \u003cp\u003e11.3.4 Comparison of CSALTs and SSALTs 190\u003c\/p\u003e \u003cp\u003eAppendix A Derivation of \u003ci\u003eH\u003csub\u003ei\u003c\/sub\u003e \u003c\/i\u003e(\u003ci\u003ea, b\u003c\/i\u003e) 191\u003c\/p\u003e \u003cp\u003eAppendix B Observed Information Matrix 193\u003c\/p\u003e \u003cp\u003eAppendix C Non-Identifiable Parameters for SSALTs Under Weibull Distribution 197\u003c\/p\u003e \u003cp\u003eAppendix D Optimal Design Under Weibull Distributions with Fixed \u003ci\u003e𝒘\u003c\/i\u003e\u003csub\u003e1\u003c\/sub\u003e 199\u003c\/p\u003e \u003cp\u003eAppendix E Conditional Expectations for Competing Risks Model Under Exponential Distribution 201\u003c\/p\u003e \u003cp\u003eAppendix F Kendall’s Tau for Frank Copula 205\u003c\/p\u003e \u003cp\u003eBibliography 207\u003c\/p\u003e \u003cp\u003eAuthor Index 217\u003c\/p\u003e \u003cp\u003eSubject Index 221\u003c\/p\u003e","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49407112937815,"sku":"9781119664000","price":93.56,"currency_code":"GBP","in_stock":false}],"url":"https:\/\/bookcurl.com\/products\/accelerated-life-testing-of-oneshot-devices-9781119664000","provider":"Book Curl","version":"1.0","type":"link"}